Deep-Learning-Based Defective Bean Inspection with GAN-Structured Automated Labeled Data Augmentation in Coffee Industry
In the production process from green beans to coffee bean packages, the defective bean removal (or in short, defect removal) is one of most labor-consuming stages, and many companies investigate the automation of this stage for minimizing human efforts. In this paper, we propose a deep-learning-base...
Main Authors: | Yung-Chien Chou, Cheng-Ju Kuo, Tzu-Ting Chen, Gwo-Jiun Horng, Mao-Yuan Pai, Mu-En Wu, Yu-Chuan Lin, Min-Hsiung Hung, Wei-Tsung Su, Yi-Chung Chen, Ding-Chau Wang, Chao-Chun Chen |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2019-10-01
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Series: | Applied Sciences |
Subjects: | |
Online Access: | https://www.mdpi.com/2076-3417/9/19/4166 |
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