Unexpected Phonon Behaviour in BiFe<sub>x</sub>Cr<sub>1−x</sub>O<sub>3</sub>, a Material System Different from Its BiFeO<sub>3</sub> and BiCrO<sub>3</sub> Parents

Unexpected Phonon Behaviour in BiFe<sub>x</sub>Cr<sub>1−x</sub>O<sub>3</sub>, a Material System Different from Its BiFeO<sub>3</sub> and BiCrO<sub>3</sub> Parents

The dielectric function and the bandgap of BiFe<sub>0.5</sub>Cr<sub>0.5</sub>O<sub>3</sub> thin films were determined from spectroscopic ellipsometry and compared with that of the parent compounds BiFeO<sub>3</sub> and BiCrO<sub>3</sub>. Th...

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Bibliographic Details
Main Authors:	Cameliu Himcinschi, Felix Drechsler, David Sebastian Walch, Akash Bhatnagar, Alexei A. Belik, Jens Kortus
Format:	Article
Language:	English
Published:	MDPI AG 2022-05-01
Series:	Nanomaterials
Subjects:	Raman spectroscopy thin films spectroscopic ellipsometry charge transfer phase transition multiferroics
Online Access:	https://www.mdpi.com/2079-4991/12/9/1607

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