PDDD-Net: Defect Detection Network Based on Parallel Attention Mechanism and Dual-Channel Spatial Pyramid Pooling
Owing to the small size of the defect pixel area and poor defect-background contrast issues in industrial images, noise and missed detection can easily occur. Therefore, automated defect detection is both necessary and challenging. To address these issues, with parallel attention mechanism (PAM) and...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2023-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/10360803/ |