Specific features of electrochemical polishing etch of single crystal silicon in a non-oxidizing etching agent

Specific features of the electrochemical etching of single crystal n- and p-type silicon in a non-oxidizing etching reagent (< 12 vol. % of HF) were studied. Pulsation of voltage-time dependence of etching was found. The obtained results are explained by the formation of a loose high-resistan...

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Main Authors: E. A. Shelonin, A. M. Kort, A. G. Yakovenko, A. A. Gvelesiani, E. N. Abramova
Format: Article
Language:Russian
Published: MIREA - Russian Technological University 2012-08-01
Series:Тонкие химические технологии
Subjects:
Online Access:https://www.finechem-mirea.ru/jour/article/view/722
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author E. A. Shelonin
A. M. Kort
A. G. Yakovenko
A. A. Gvelesiani
E. N. Abramova
author_facet E. A. Shelonin
A. M. Kort
A. G. Yakovenko
A. A. Gvelesiani
E. N. Abramova
author_sort E. A. Shelonin
collection DOAJ
description Specific features of the electrochemical etching of single crystal n- and p-type silicon in a non-oxidizing etching reagent (< 12 vol. % of HF) were studied. Pulsation of voltage-time dependence of etching was found. The obtained results are explained by the formation of a loose high-resistance layer of complex fluorides and silicon oxides on the surface of the silicon substrate, as well as by differences in the nature of n- and p-type silicon etching.
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spelling doaj.art-972302901bfa4fc58b6df43988e855712023-03-13T07:25:33ZrusMIREA - Russian Technological UniversityТонкие химические технологии2410-65932686-75752012-08-01748487716Specific features of electrochemical polishing etch of single crystal silicon in a non-oxidizing etching agentE. A. Shelonin0A. M. Kort1A. G. Yakovenko2A. A. Gvelesiani3E. N. Abramova4МИТХТ им. М.В. ЛомоносоваМИТХТ им. М.В. ЛомоносоваM.V. Lomonosov Moscow State University of Fine Chemical Technologies, 86, Vernadskogo pr., Moscow 119571M.V. Lomonosov Moscow State University of Fine Chemical Technologies, 86, Vernadskogo pr., Moscow 119571M.V. Lomonosov Moscow State University of Fine Chemical Technologies, 86, Vernadskogo pr., Moscow 119571Specific features of the electrochemical etching of single crystal n- and p-type silicon in a non-oxidizing etching reagent (< 12 vol. % of HF) were studied. Pulsation of voltage-time dependence of etching was found. The obtained results are explained by the formation of a loose high-resistance layer of complex fluorides and silicon oxides on the surface of the silicon substrate, as well as by differences in the nature of n- and p-type silicon etching.https://www.finechem-mirea.ru/jour/article/view/722nanoporous siliconelectrochemical etchingpulsationthin surface layergalvanostatic modepulsationhigh-ohmic layer
spellingShingle E. A. Shelonin
A. M. Kort
A. G. Yakovenko
A. A. Gvelesiani
E. N. Abramova
Specific features of electrochemical polishing etch of single crystal silicon in a non-oxidizing etching agent
Тонкие химические технологии
nanoporous silicon
electrochemical etching
pulsation
thin surface layer
galvanostatic mode
pulsation
high-ohmic layer
title Specific features of electrochemical polishing etch of single crystal silicon in a non-oxidizing etching agent
title_full Specific features of electrochemical polishing etch of single crystal silicon in a non-oxidizing etching agent
title_fullStr Specific features of electrochemical polishing etch of single crystal silicon in a non-oxidizing etching agent
title_full_unstemmed Specific features of electrochemical polishing etch of single crystal silicon in a non-oxidizing etching agent
title_short Specific features of electrochemical polishing etch of single crystal silicon in a non-oxidizing etching agent
title_sort specific features of electrochemical polishing etch of single crystal silicon in a non oxidizing etching agent
topic nanoporous silicon
electrochemical etching
pulsation
thin surface layer
galvanostatic mode
pulsation
high-ohmic layer
url https://www.finechem-mirea.ru/jour/article/view/722
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AT agyakovenko specificfeaturesofelectrochemicalpolishingetchofsinglecrystalsiliconinanonoxidizingetchingagent
AT aagvelesiani specificfeaturesofelectrochemicalpolishingetchofsinglecrystalsiliconinanonoxidizingetchingagent
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