On-Chip Error Detection Reusing Built-In Self-Repair for Silicon Debug
Post-silicon debug has become important with the increased complexity of circuit designs. However, the increase in debug resource costs owing to improved observability has posed a major challenge. To overcome this challenge, this study proposes on-chip error detection that reuses built-in self-repai...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
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IEEE
2021-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/9398706/ |
| _version_ | 1819327189924970496 |
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| author | Hayoung Lee Hyunggoy Oh Sungho Kang |
| author_facet | Hayoung Lee Hyunggoy Oh Sungho Kang |
| author_sort | Hayoung Lee |
| collection | DOAJ |
| description | Post-silicon debug has become important with the increased complexity of circuit designs. However, the increase in debug resource costs owing to improved observability has posed a major challenge. To overcome this challenge, this study proposes on-chip error detection that reuses built-in self-repair (BISR). The proposed method utilizes the components of BISR as storages of golden signatures and comparators for error detection. Also, it detects error-suspect cycles more precisely by using parent and child multiple-input signature registers (MISRs). In addition, it provides selective capture and store methods that selectively capture error-suspect debug data in buffers and store them in the DRAM, respectively. The experimental results of various debug cases demonstrate that the proposed method significantly reduces the buffer size, DRAM usage, and debug time compared to previous methods. |
| first_indexed | 2024-12-24T13:06:54Z |
| format | Article |
| id | doaj.art-9865f20309de46f193ca144c6cd8a675 |
| institution | Directory Open Access Journal |
| issn | 2169-3536 |
| language | English |
| last_indexed | 2024-12-24T13:06:54Z |
| publishDate | 2021-01-01 |
| publisher | IEEE |
| record_format | Article |
| series | IEEE Access |
| spelling | doaj.art-9865f20309de46f193ca144c6cd8a6752022-12-21T16:53:59ZengIEEEIEEE Access2169-35362021-01-019564435645610.1109/ACCESS.2021.30715179398706On-Chip Error Detection Reusing Built-In Self-Repair for Silicon DebugHayoung Lee0https://orcid.org/0000-0002-6868-0829Hyunggoy Oh1Sungho Kang2https://orcid.org/0000-0002-7093-2095Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South KoreaDepartment of Electrical and Electronic Engineering, Yonsei University, Seoul, South KoreaDepartment of Electrical and Electronic Engineering, Yonsei University, Seoul, South KoreaPost-silicon debug has become important with the increased complexity of circuit designs. However, the increase in debug resource costs owing to improved observability has posed a major challenge. To overcome this challenge, this study proposes on-chip error detection that reuses built-in self-repair (BISR). The proposed method utilizes the components of BISR as storages of golden signatures and comparators for error detection. Also, it detects error-suspect cycles more precisely by using parent and child multiple-input signature registers (MISRs). In addition, it provides selective capture and store methods that selectively capture error-suspect debug data in buffers and store them in the DRAM, respectively. The experimental results of various debug cases demonstrate that the proposed method significantly reduces the buffer size, DRAM usage, and debug time compared to previous methods.https://ieeexplore.ieee.org/document/9398706/Post-silicon debugerror detectiondynamic random-access memory (DRAM) usagedebug timearea overheadbuilt-in self-repair (BISR) |
| spellingShingle | Hayoung Lee Hyunggoy Oh Sungho Kang On-Chip Error Detection Reusing Built-In Self-Repair for Silicon Debug IEEE Access Post-silicon debug error detection dynamic random-access memory (DRAM) usage debug time area overhead built-in self-repair (BISR) |
| title | On-Chip Error Detection Reusing Built-In Self-Repair for Silicon Debug |
| title_full | On-Chip Error Detection Reusing Built-In Self-Repair for Silicon Debug |
| title_fullStr | On-Chip Error Detection Reusing Built-In Self-Repair for Silicon Debug |
| title_full_unstemmed | On-Chip Error Detection Reusing Built-In Self-Repair for Silicon Debug |
| title_short | On-Chip Error Detection Reusing Built-In Self-Repair for Silicon Debug |
| title_sort | on chip error detection reusing built in self repair for silicon debug |
| topic | Post-silicon debug error detection dynamic random-access memory (DRAM) usage debug time area overhead built-in self-repair (BISR) |
| url | https://ieeexplore.ieee.org/document/9398706/ |
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