X-Ray Spectroscopy of Ultra-Thin Oxide/Oxide Heteroepitaxial Films: A Case Study of Single-Nanometer VO2/TiO2
Epitaxial ultra-thin oxide films can support large percent level strains well beyond their bulk counterparts, thereby enabling strain-engineering in oxides that can tailor various phenomena. At these reduced dimensions (typically < 10 nm), contributions from the substrate can dwarf the signal...
Main Authors: | Nicholas F. Quackenbush, Hanjong Paik, Joseph C. Woicik, Dario A. Arena, Darrell G. Schlom, Louis F. J. Piper |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2015-08-01
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Series: | Materials |
Subjects: | |
Online Access: | http://www.mdpi.com/1996-1944/8/8/5255 |
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