Morphology Evolution of Nanoscale-Thick Au/Pd Bimetallic Films on Silicon Carbide Substrate

Morphology Evolution of Nanoscale-Thick Au/Pd Bimetallic Films on Silicon Carbide Substrate

Bimetallic Au/Pd nanoscale-thick films were sputter-deposited at room temperature on a silicon carbide (SiC) surface, and the surface-morphology evolution of the films versus thickness was studied with scanning electron microscopy. This study allowed to elucidate the Au/Pd growth mechanism by identi...

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Bibliographic Details
Main Authors: Francesco Ruffino, Maria Censabella, Giovanni Piccitto, Maria Grazia Grimaldi
Format: Article
Language:English
Published: MDPI AG 2020-04-01
Series:Micromachines
Subjects:
Au/Pd
SiC
nanomorphology
coalescence
percolation
scanning electron microscopy
Online Access:https://www.mdpi.com/2072-666X/11/4/410

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