Low-radiation dose XRF excited by MeV protons for cultural heritage samples

Abstract In this work, we tested a setup of X-ray fluorescence (XRF) excited by proton-induced quasi-monochromatic X-rays (proton-induced XRF (PIXRF)) as a low-radiation dose analytical technique for precious cultural heritage samples. The low-dose performance of the PIXRF is experimentally assessed...

Full description

Bibliographic Details
Main Authors: Yoshiyuki Oguri, Hitoshi Fukuda, Jun Hasegawa, Naoto Hagura
Format: Article
Language:English
Published: SpringerOpen 2023-05-01
Series:Heritage Science
Subjects:
Online Access:https://doi.org/10.1186/s40494-023-00946-z
_version_ 1797822750678581248
author Yoshiyuki Oguri
Hitoshi Fukuda
Jun Hasegawa
Naoto Hagura
author_facet Yoshiyuki Oguri
Hitoshi Fukuda
Jun Hasegawa
Naoto Hagura
author_sort Yoshiyuki Oguri
collection DOAJ
description Abstract In this work, we tested a setup of X-ray fluorescence (XRF) excited by proton-induced quasi-monochromatic X-rays (proton-induced XRF (PIXRF)) as a low-radiation dose analytical technique for precious cultural heritage samples. The low-dose performance of the PIXRF is experimentally assessed in comparison with the performance of a conventional XRF. For this assessment, we prepared test samples, which simulated original Japanese paintings with copper-bearing pigments. By introducing a figure-of-merit, the PIXRF is found to potentially give a better performance in terms of the radiation dose to the sample and the limit of detection, albeit the degraded multi-elemental analytical capability. PIXRF can be a cost-effective method to perform low dose measurements of precious samples, if introduced in an existing PIXE facility.
first_indexed 2024-03-13T10:13:47Z
format Article
id doaj.art-9a3b05263e7942adbc8db6fce86b3763
institution Directory Open Access Journal
issn 2050-7445
language English
last_indexed 2024-03-13T10:13:47Z
publishDate 2023-05-01
publisher SpringerOpen
record_format Article
series Heritage Science
spelling doaj.art-9a3b05263e7942adbc8db6fce86b37632023-05-21T11:23:03ZengSpringerOpenHeritage Science2050-74452023-05-0111111210.1186/s40494-023-00946-zLow-radiation dose XRF excited by MeV protons for cultural heritage samplesYoshiyuki Oguri0Hitoshi Fukuda1Jun Hasegawa2Naoto Hagura3NAT Research Center, NAT CorporationSafety and Radiation Management Division, Open Facility Center, Tokyo Institute of TechnologyLaboratory for Zero-Carbon Energy, Institute of Innovative Research, Tokyo Institute of TechnologyDepartment of Nuclear Safety Engineering, Tokyo City UniversityAbstract In this work, we tested a setup of X-ray fluorescence (XRF) excited by proton-induced quasi-monochromatic X-rays (proton-induced XRF (PIXRF)) as a low-radiation dose analytical technique for precious cultural heritage samples. The low-dose performance of the PIXRF is experimentally assessed in comparison with the performance of a conventional XRF. For this assessment, we prepared test samples, which simulated original Japanese paintings with copper-bearing pigments. By introducing a figure-of-merit, the PIXRF is found to potentially give a better performance in terms of the radiation dose to the sample and the limit of detection, albeit the degraded multi-elemental analytical capability. PIXRF can be a cost-effective method to perform low dose measurements of precious samples, if introduced in an existing PIXE facility.https://doi.org/10.1186/s40494-023-00946-zXRFPIXEProton-induced X-rayRadiation damageLimit of detectionRadiation dose
spellingShingle Yoshiyuki Oguri
Hitoshi Fukuda
Jun Hasegawa
Naoto Hagura
Low-radiation dose XRF excited by MeV protons for cultural heritage samples
Heritage Science
XRF
PIXE
Proton-induced X-ray
Radiation damage
Limit of detection
Radiation dose
title Low-radiation dose XRF excited by MeV protons for cultural heritage samples
title_full Low-radiation dose XRF excited by MeV protons for cultural heritage samples
title_fullStr Low-radiation dose XRF excited by MeV protons for cultural heritage samples
title_full_unstemmed Low-radiation dose XRF excited by MeV protons for cultural heritage samples
title_short Low-radiation dose XRF excited by MeV protons for cultural heritage samples
title_sort low radiation dose xrf excited by mev protons for cultural heritage samples
topic XRF
PIXE
Proton-induced X-ray
Radiation damage
Limit of detection
Radiation dose
url https://doi.org/10.1186/s40494-023-00946-z
work_keys_str_mv AT yoshiyukioguri lowradiationdosexrfexcitedbymevprotonsforculturalheritagesamples
AT hitoshifukuda lowradiationdosexrfexcitedbymevprotonsforculturalheritagesamples
AT junhasegawa lowradiationdosexrfexcitedbymevprotonsforculturalheritagesamples
AT naotohagura lowradiationdosexrfexcitedbymevprotonsforculturalheritagesamples