Low-radiation dose XRF excited by MeV protons for cultural heritage samples

Low-radiation dose XRF excited by MeV protons for cultural heritage samples

Abstract In this work, we tested a setup of X-ray fluorescence (XRF) excited by proton-induced quasi-monochromatic X-rays (proton-induced XRF (PIXRF)) as a low-radiation dose analytical technique for precious cultural heritage samples. The low-dose performance of the PIXRF is experimentally assessed...

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Bibliographic Details
Main Authors: Yoshiyuki Oguri, Hitoshi Fukuda, Jun Hasegawa, Naoto Hagura
Format: Article
Language:English
Published: SpringerOpen 2023-05-01
Series:Heritage Science
Subjects:
XRF
PIXE
Proton-induced X-ray
Radiation damage
Limit of detection
Radiation dose
Online Access:https://doi.org/10.1186/s40494-023-00946-z

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