A Deep Convolutional Generative Adversarial Networks-Based Method for Defect Detection in Small Sample Industrial Parts Images

A Deep Convolutional Generative Adversarial Networks-Based Method for Defect Detection in Small Sample Industrial Parts Images

Online defect detection in small industrial parts is of paramount importance for building closed loop intelligent manufacturing systems. However, high-efficiency and high-precision detection of surface defects in these manufacturing systems is a difficult task and poses a major research challenge. T...

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Bibliographic Details
Main Authors:	Hongbin Gao, Ya Zhang, Wenkai Lv, Jiawei Yin, Tehreem Qasim, Dongyun Wang
Format:	Article
Language:	English
Published:	MDPI AG 2022-06-01
Series:	Applied Sciences
Subjects:	defect detection deep convolution generation adversarial network data augmentation lightweight model
Online Access:	https://www.mdpi.com/2076-3417/12/13/6569

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