CNN-Based Laue Spot Morphology Predictor for Reliable Crystallographic Descriptor Estimation

Laue microdiffraction is an X-ray diffraction technique that allows for the non-destructive acquisition of spatial maps of crystallographic orientation and the strain state of (poly)crystalline specimens. To do so, diffraction patterns, consisting of thousands of Laue spots, are collected and analyz...

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Bibliographic Details
Main Authors: Tom Kirstein, Lukas Petrich, Ravi Raj Purohit Purushottam Raj Purohit, Jean-Sébastien Micha, Volker Schmidt
Format: Article
Language:English
Published: MDPI AG 2023-04-01
Series:Materials
Subjects:
Online Access:https://www.mdpi.com/1996-1944/16/9/3397