Probing viscoelastic surfaces with bimodal tapping-mode atomic force microscopy: Underlying physics and observables for a standard linear solid model
This paper presents computational simulations of single-mode and bimodal atomic force microscopy (AFM) with particular focus on the viscoelastic interactions occurring during tip–sample impact. The surface is modeled by using a standard linear solid model, which is the simplest system that can repro...
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| Format: | Article |
| Language: | English |
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Beilstein-Institut
2014-09-01
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| Series: | Beilstein Journal of Nanotechnology |
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| Online Access: | https://doi.org/10.3762/bjnano.5.176 |
| _version_ | 1811336833078919168 |
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| author | Santiago D. Solares |
| author_facet | Santiago D. Solares |
| author_sort | Santiago D. Solares |
| collection | DOAJ |
| description | This paper presents computational simulations of single-mode and bimodal atomic force microscopy (AFM) with particular focus on the viscoelastic interactions occurring during tip–sample impact. The surface is modeled by using a standard linear solid model, which is the simplest system that can reproduce creep compliance and stress relaxation, which are fundamental behaviors exhibited by viscoelastic surfaces. The relaxation of the surface in combination with the complexities of bimodal tip–sample impacts gives rise to unique dynamic behaviors that have important consequences with regards to the acquisition of quantitative relationships between the sample properties and the AFM observables. The physics of the tip–sample interactions and its effect on the observables are illustrated and discussed, and a brief research outlook on viscoelasticity measurement with intermittent-contact AFM is provided. |
| first_indexed | 2024-04-13T17:45:18Z |
| format | Article |
| id | doaj.art-9ae4062d6ca14fc2bd2d254a110e5752 |
| institution | Directory Open Access Journal |
| issn | 2190-4286 |
| language | English |
| last_indexed | 2024-04-13T17:45:18Z |
| publishDate | 2014-09-01 |
| publisher | Beilstein-Institut |
| record_format | Article |
| series | Beilstein Journal of Nanotechnology |
| spelling | doaj.art-9ae4062d6ca14fc2bd2d254a110e57522022-12-22T02:37:01ZengBeilstein-InstitutBeilstein Journal of Nanotechnology2190-42862014-09-01511649166310.3762/bjnano.5.1762190-4286-5-176Probing viscoelastic surfaces with bimodal tapping-mode atomic force microscopy: Underlying physics and observables for a standard linear solid modelSantiago D. Solares0Department of Mechanical Engineering, University of Maryland, College Park, MD 20742, USAThis paper presents computational simulations of single-mode and bimodal atomic force microscopy (AFM) with particular focus on the viscoelastic interactions occurring during tip–sample impact. The surface is modeled by using a standard linear solid model, which is the simplest system that can reproduce creep compliance and stress relaxation, which are fundamental behaviors exhibited by viscoelastic surfaces. The relaxation of the surface in combination with the complexities of bimodal tip–sample impacts gives rise to unique dynamic behaviors that have important consequences with regards to the acquisition of quantitative relationships between the sample properties and the AFM observables. The physics of the tip–sample interactions and its effect on the observables are illustrated and discussed, and a brief research outlook on viscoelasticity measurement with intermittent-contact AFM is provided.https://doi.org/10.3762/bjnano.5.176amplitude-modulationbimodaldissipationfrequency modulationmulti-frequency atomic force microscopyviscoelasticitystandard linear solid |
| spellingShingle | Santiago D. Solares Probing viscoelastic surfaces with bimodal tapping-mode atomic force microscopy: Underlying physics and observables for a standard linear solid model Beilstein Journal of Nanotechnology amplitude-modulation bimodal dissipation frequency modulation multi-frequency atomic force microscopy viscoelasticity standard linear solid |
| title | Probing viscoelastic surfaces with bimodal tapping-mode atomic force microscopy: Underlying physics and observables for a standard linear solid model |
| title_full | Probing viscoelastic surfaces with bimodal tapping-mode atomic force microscopy: Underlying physics and observables for a standard linear solid model |
| title_fullStr | Probing viscoelastic surfaces with bimodal tapping-mode atomic force microscopy: Underlying physics and observables for a standard linear solid model |
| title_full_unstemmed | Probing viscoelastic surfaces with bimodal tapping-mode atomic force microscopy: Underlying physics and observables for a standard linear solid model |
| title_short | Probing viscoelastic surfaces with bimodal tapping-mode atomic force microscopy: Underlying physics and observables for a standard linear solid model |
| title_sort | probing viscoelastic surfaces with bimodal tapping mode atomic force microscopy underlying physics and observables for a standard linear solid model |
| topic | amplitude-modulation bimodal dissipation frequency modulation multi-frequency atomic force microscopy viscoelasticity standard linear solid |
| url | https://doi.org/10.3762/bjnano.5.176 |
| work_keys_str_mv | AT santiagodsolares probingviscoelasticsurfaceswithbimodaltappingmodeatomicforcemicroscopyunderlyingphysicsandobservablesforastandardlinearsolidmodel |