An Instrument for the Characterization and Calibration of Optical Sensors
This paper presents the development of a hardware/software system for the characterization of the electronic response of optical (camera) sensors such as matrix and linear color and monochrome Charge Coupled Device (CCD) or Complementary Metal Oxide Semiconductor (CMOS). The electronic response of a...
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| Format: | Article |
| Language: | English |
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MDPI AG
2021-07-01
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| Series: | Sensors |
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| Online Access: | https://www.mdpi.com/1424-8220/21/15/5141 |
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| author | Enrico Gastasini Niccolò Capecci Francesco Lupi Alessio Gagliardi Sergio Saponara Michele Lanzetta |
| author_facet | Enrico Gastasini Niccolò Capecci Francesco Lupi Alessio Gagliardi Sergio Saponara Michele Lanzetta |
| author_sort | Enrico Gastasini |
| collection | DOAJ |
| description | This paper presents the development of a hardware/software system for the characterization of the electronic response of optical (camera) sensors such as matrix and linear color and monochrome Charge Coupled Device (CCD) or Complementary Metal Oxide Semiconductor (CMOS). The electronic response of a sensor is required for inspection purposes. It also allows the design and calibration of the integrating device to achieve the desired performance. The proposed instrument equipment fulfills the most recent European Machine Vision Association (EMVA) 1288 standard ver. 3.1: the spatial non uniformity of the illumination Δ<i>E</i> must be under 3%, and the sensor must achieve an f-number of 8.0 concerning the light source. The following main innovations have achieved this: an Ulbricht sphere providing a uniform light distribution (irradiation) of 99.54%; an innovative illuminator with proper positioning of color Light Emitting Diodes (LEDs) and control electronics; and a flexible C# program to analyze the sensor parameters, namely Quantum Efficiency, Overall System Gain, Temporal Dark Noise, Dark Signal Non Uniformity (DSNU1288), Photo Response Non-Uniformity (PRNU1288), Maximum achievable Signal to Noise Ratio (SNRmax), Absolute sensitivity threshold, Saturation Capacity, Dynamic Range, and Dark Current. This new instrument has allowed a camera manufacturer to design, integrate, and inspect numerous devices and camera models (Necta, Celera, and Aria). |
| first_indexed | 2024-03-10T09:08:20Z |
| format | Article |
| id | doaj.art-9be14127616d4091b1f39811554954b0 |
| institution | Directory Open Access Journal |
| issn | 1424-8220 |
| language | English |
| last_indexed | 2024-03-10T09:08:20Z |
| publishDate | 2021-07-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Sensors |
| spelling | doaj.art-9be14127616d4091b1f39811554954b02023-11-22T06:11:03ZengMDPI AGSensors1424-82202021-07-012115514110.3390/s21155141An Instrument for the Characterization and Calibration of Optical SensorsEnrico Gastasini0Niccolò Capecci1Francesco Lupi2Alessio Gagliardi3Sergio Saponara4Michele Lanzetta5Alkeria Srl, Via Mario Giuntini 25, 56021 Cascina, ItalyAlkeria Srl, Via Mario Giuntini 25, 56021 Cascina, ItalyDepartment of Civil and Industrial Engineering, University of Pisa, 56126 Pisa, ItalyDepartment of Information Engineering, University of Pisa, Via G. Caruso 16, 56127 Pisa, ItalyDepartment of Information Engineering, University of Pisa, Via G. Caruso 16, 56127 Pisa, ItalyDepartment of Civil and Industrial Engineering, University of Pisa, 56126 Pisa, ItalyThis paper presents the development of a hardware/software system for the characterization of the electronic response of optical (camera) sensors such as matrix and linear color and monochrome Charge Coupled Device (CCD) or Complementary Metal Oxide Semiconductor (CMOS). The electronic response of a sensor is required for inspection purposes. It also allows the design and calibration of the integrating device to achieve the desired performance. The proposed instrument equipment fulfills the most recent European Machine Vision Association (EMVA) 1288 standard ver. 3.1: the spatial non uniformity of the illumination Δ<i>E</i> must be under 3%, and the sensor must achieve an f-number of 8.0 concerning the light source. The following main innovations have achieved this: an Ulbricht sphere providing a uniform light distribution (irradiation) of 99.54%; an innovative illuminator with proper positioning of color Light Emitting Diodes (LEDs) and control electronics; and a flexible C# program to analyze the sensor parameters, namely Quantum Efficiency, Overall System Gain, Temporal Dark Noise, Dark Signal Non Uniformity (DSNU1288), Photo Response Non-Uniformity (PRNU1288), Maximum achievable Signal to Noise Ratio (SNRmax), Absolute sensitivity threshold, Saturation Capacity, Dynamic Range, and Dark Current. This new instrument has allowed a camera manufacturer to design, integrate, and inspect numerous devices and camera models (Necta, Celera, and Aria).https://www.mdpi.com/1424-8220/21/15/5141optical apparatuscamera testinglight uniformityCCDCMOSEMVA 1288 standard |
| spellingShingle | Enrico Gastasini Niccolò Capecci Francesco Lupi Alessio Gagliardi Sergio Saponara Michele Lanzetta An Instrument for the Characterization and Calibration of Optical Sensors Sensors optical apparatus camera testing light uniformity CCD CMOS EMVA 1288 standard |
| title | An Instrument for the Characterization and Calibration of Optical Sensors |
| title_full | An Instrument for the Characterization and Calibration of Optical Sensors |
| title_fullStr | An Instrument for the Characterization and Calibration of Optical Sensors |
| title_full_unstemmed | An Instrument for the Characterization and Calibration of Optical Sensors |
| title_short | An Instrument for the Characterization and Calibration of Optical Sensors |
| title_sort | instrument for the characterization and calibration of optical sensors |
| topic | optical apparatus camera testing light uniformity CCD CMOS EMVA 1288 standard |
| url | https://www.mdpi.com/1424-8220/21/15/5141 |
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