Application of FFT Data from HREM images to Electron crystallography
We succesfully determined the 3D crystal structure of inorganic nano-crystalline material using fast fourier transform (FFT) data from high-resolution electron microscopy (HREM) images. For extracting the reliable structure information from nano-crystalline materials by HREM imaging, it is essential...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
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SpringerOpen
2012-03-01
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| Series: | Journal of Analytical Science and Technology |
| Subjects: | |
| Online Access: | http://www.jastmag.org/journal/view.php?number=89 |
| _version_ | 1818413984326352896 |
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| author | Snag-Gil Lee Youn-Joong Kim Seung-Jo Yoo Seok-Hoon Lee Jin-Gyu Kim |
| author_facet | Snag-Gil Lee Youn-Joong Kim Seung-Jo Yoo Seok-Hoon Lee Jin-Gyu Kim |
| author_sort | Snag-Gil Lee |
| collection | DOAJ |
| description | We succesfully determined the 3D crystal structure of inorganic nano-crystalline material using fast fourier transform (FFT) data from high-resolution electron microscopy (HREM) images. For extracting the reliable structure information from nano-crystalline materials by HREM imaging, it is essential to minimize the dynamical scattering effects happend from interactions bewteen electrons and matters. To alleviate this restriction, we tried to solve the crystal structure by employing high voltage electron microscope (HVEM) which has excellent tilting capability, atomic resolution as well as higher penetration power. First, the allowed sample thickness for CaMoO4 crystal was evaluated by examining the existence of forbidden reflections in FFT data of HREM images obtained at various sample thickness. The kinematical scattering conditions were satisfied up to a sample thickness of about 28.2 nm. Next, we tried to extract the crystallographic data and determine the atomic structure of CaMoO4 crystal by FFT analysis of HREM images obtained from 15 different zone axes. Consequently, its cell parameters and space group were a = 5.24(3) Å, c = 11.50(8) Å and I41/a (#88), respectively. These values were coincided with X-ray crystallography results within 0.002 ~ 0.080 Å. Finally, the atomic structure could be determined with an accuracy of 0.16 Å. |
| first_indexed | 2024-12-14T11:11:53Z |
| format | Article |
| id | doaj.art-9bf5b33722a04c4abb6089a8572d663e |
| institution | Directory Open Access Journal |
| issn | 2093-3134 2093-3371 |
| language | English |
| last_indexed | 2024-12-14T11:11:53Z |
| publishDate | 2012-03-01 |
| publisher | SpringerOpen |
| record_format | Article |
| series | Journal of Analytical Science and Technology |
| spelling | doaj.art-9bf5b33722a04c4abb6089a8572d663e2022-12-21T23:04:14ZengSpringerOpenJournal of Analytical Science and Technology2093-31342093-33712012-03-0131128134Application of FFT Data from HREM images to Electron crystallographySnag-Gil LeeYoun-Joong KimSeung-Jo YooSeok-Hoon LeeJin-Gyu KimWe succesfully determined the 3D crystal structure of inorganic nano-crystalline material using fast fourier transform (FFT) data from high-resolution electron microscopy (HREM) images. For extracting the reliable structure information from nano-crystalline materials by HREM imaging, it is essential to minimize the dynamical scattering effects happend from interactions bewteen electrons and matters. To alleviate this restriction, we tried to solve the crystal structure by employing high voltage electron microscope (HVEM) which has excellent tilting capability, atomic resolution as well as higher penetration power. First, the allowed sample thickness for CaMoO4 crystal was evaluated by examining the existence of forbidden reflections in FFT data of HREM images obtained at various sample thickness. The kinematical scattering conditions were satisfied up to a sample thickness of about 28.2 nm. Next, we tried to extract the crystallographic data and determine the atomic structure of CaMoO4 crystal by FFT analysis of HREM images obtained from 15 different zone axes. Consequently, its cell parameters and space group were a = 5.24(3) Å, c = 11.50(8) Å and I41/a (#88), respectively. These values were coincided with X-ray crystallography results within 0.002 ~ 0.080 Å. Finally, the atomic structure could be determined with an accuracy of 0.16 Å.http://www.jastmag.org/journal/view.php?number=89High voltage electron microscopeFast fourier transformElectron crystallographyHigh-resolution electron microscopyCaMoO4 |
| spellingShingle | Snag-Gil Lee Youn-Joong Kim Seung-Jo Yoo Seok-Hoon Lee Jin-Gyu Kim Application of FFT Data from HREM images to Electron crystallography Journal of Analytical Science and Technology High voltage electron microscope Fast fourier transform Electron crystallography High-resolution electron microscopy CaMoO4 |
| title | Application of FFT Data from HREM images to Electron crystallography |
| title_full | Application of FFT Data from HREM images to Electron crystallography |
| title_fullStr | Application of FFT Data from HREM images to Electron crystallography |
| title_full_unstemmed | Application of FFT Data from HREM images to Electron crystallography |
| title_short | Application of FFT Data from HREM images to Electron crystallography |
| title_sort | application of fft data from hrem images to electron crystallography |
| topic | High voltage electron microscope Fast fourier transform Electron crystallography High-resolution electron microscopy CaMoO4 |
| url | http://www.jastmag.org/journal/view.php?number=89 |
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