Reliable transport through a microfabricated X-junction surface-electrode ion trap
We report the design, fabrication and characterization of a microfabricated surface-electrode ion trap that supports controlled transport through the two-dimensional intersection of linear trapping zones arranged in a 90° cross. The trap is fabricated with very large scalable integration techniques...
| Main Authors: | , , , , , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IOP Publishing
2013-01-01
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| Series: | New Journal of Physics |
| Online Access: | https://doi.org/10.1088/1367-2630/15/3/033004 |
| _version_ | 1797751726779924480 |
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| author | Kenneth Wright Jason M Amini Daniel L Faircloth Curtis Volin S Charles Doret Harley Hayden C-S Pai David W Landgren Douglas Denison Tyler Killian Richart E Slusher Alexa W Harter |
| author_facet | Kenneth Wright Jason M Amini Daniel L Faircloth Curtis Volin S Charles Doret Harley Hayden C-S Pai David W Landgren Douglas Denison Tyler Killian Richart E Slusher Alexa W Harter |
| author_sort | Kenneth Wright |
| collection | DOAJ |
| description | We report the design, fabrication and characterization of a microfabricated surface-electrode ion trap that supports controlled transport through the two-dimensional intersection of linear trapping zones arranged in a 90° cross. The trap is fabricated with very large scalable integration techniques which are compatible with scaling to a large quantum information processor. The shape of the radio-frequency electrodes is optimized with a genetic algorithm to reduce axial pseudopotential barriers and minimize ion heating during transport. Seventy-eight independent dc control electrodes enable fine control of the trapping potentials. We demonstrate reliable ion transport between junction legs and determine the rate of ion loss due to transport. Doppler-cooled ions survive more than 10 ^5 round-trip transits between junction legs without loss and more than 65 consecutive round trips without laser cooling. |
| first_indexed | 2024-03-12T16:52:50Z |
| format | Article |
| id | doaj.art-9c09aea494564e11b6413bad3a43ba83 |
| institution | Directory Open Access Journal |
| issn | 1367-2630 |
| language | English |
| last_indexed | 2024-03-12T16:52:50Z |
| publishDate | 2013-01-01 |
| publisher | IOP Publishing |
| record_format | Article |
| series | New Journal of Physics |
| spelling | doaj.art-9c09aea494564e11b6413bad3a43ba832023-08-08T11:05:34ZengIOP PublishingNew Journal of Physics1367-26302013-01-0115303300410.1088/1367-2630/15/3/033004Reliable transport through a microfabricated X-junction surface-electrode ion trapKenneth Wright0Jason M Amini1Daniel L Faircloth2Curtis Volin3S Charles Doret4Harley Hayden5C-S Pai6David W Landgren7Douglas Denison8Tyler Killian9Richart E Slusher10Alexa W Harter11Georgia Tech Research Institute , Atlanta, GA 30332, USAGeorgia Tech Research Institute , Atlanta, GA 30332, USAGeorgia Tech Research Institute , Atlanta, GA 30332, USAGeorgia Tech Research Institute , Atlanta, GA 30332, USAGeorgia Tech Research Institute , Atlanta, GA 30332, USAGeorgia Tech Research Institute , Atlanta, GA 30332, USAGeorgia Tech Research Institute , Atlanta, GA 30332, USAGeorgia Tech Research Institute , Atlanta, GA 30332, USAGeorgia Tech Research Institute , Atlanta, GA 30332, USAGeorgia Tech Research Institute , Atlanta, GA 30332, USAGeorgia Tech Research Institute , Atlanta, GA 30332, USAGeorgia Tech Research Institute , Atlanta, GA 30332, USAWe report the design, fabrication and characterization of a microfabricated surface-electrode ion trap that supports controlled transport through the two-dimensional intersection of linear trapping zones arranged in a 90° cross. The trap is fabricated with very large scalable integration techniques which are compatible with scaling to a large quantum information processor. The shape of the radio-frequency electrodes is optimized with a genetic algorithm to reduce axial pseudopotential barriers and minimize ion heating during transport. Seventy-eight independent dc control electrodes enable fine control of the trapping potentials. We demonstrate reliable ion transport between junction legs and determine the rate of ion loss due to transport. Doppler-cooled ions survive more than 10 ^5 round-trip transits between junction legs without loss and more than 65 consecutive round trips without laser cooling.https://doi.org/10.1088/1367-2630/15/3/033004 |
| spellingShingle | Kenneth Wright Jason M Amini Daniel L Faircloth Curtis Volin S Charles Doret Harley Hayden C-S Pai David W Landgren Douglas Denison Tyler Killian Richart E Slusher Alexa W Harter Reliable transport through a microfabricated X-junction surface-electrode ion trap New Journal of Physics |
| title | Reliable transport through a microfabricated X-junction surface-electrode ion trap |
| title_full | Reliable transport through a microfabricated X-junction surface-electrode ion trap |
| title_fullStr | Reliable transport through a microfabricated X-junction surface-electrode ion trap |
| title_full_unstemmed | Reliable transport through a microfabricated X-junction surface-electrode ion trap |
| title_short | Reliable transport through a microfabricated X-junction surface-electrode ion trap |
| title_sort | reliable transport through a microfabricated x junction surface electrode ion trap |
| url | https://doi.org/10.1088/1367-2630/15/3/033004 |
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