Reliable transport through a microfabricated X-junction surface-electrode ion trap

Reliable transport through a microfabricated X-junction surface-electrode ion trap

We report the design, fabrication and characterization of a microfabricated surface-electrode ion trap that supports controlled transport through the two-dimensional intersection of linear trapping zones arranged in a 90° cross. The trap is fabricated with very large scalable integration techniques...

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Bibliographic Details
Main Authors: Kenneth Wright, Jason M Amini, Daniel L Faircloth, Curtis Volin, S Charles Doret, Harley Hayden, C-S Pai, David W Landgren, Douglas Denison, Tyler Killian, Richart E Slusher, Alexa W Harter
Format: Article
Language:English
Published: IOP Publishing 2013-01-01
Series:New Journal of Physics
Online Access:https://doi.org/10.1088/1367-2630/15/3/033004

Internet

https://doi.org/10.1088/1367-2630/15/3/033004

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