Reliable transport through a microfabricated X-junction surface-electrode ion trap
We report the design, fabrication and characterization of a microfabricated surface-electrode ion trap that supports controlled transport through the two-dimensional intersection of linear trapping zones arranged in a 90° cross. The trap is fabricated with very large scalable integration techniques...
Main Authors: | Kenneth Wright, Jason M Amini, Daniel L Faircloth, Curtis Volin, S Charles Doret, Harley Hayden, C-S Pai, David W Landgren, Douglas Denison, Tyler Killian, Richart E Slusher, Alexa W Harter |
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Format: | Article |
Language: | English |
Published: |
IOP Publishing
2013-01-01
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Series: | New Journal of Physics |
Online Access: | https://doi.org/10.1088/1367-2630/15/3/033004 |
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