Probing interlayer shear thermal deformation in atomically-thin van der Waals layered materials
Van der Waals materials exhibit unique thermomechanical properties, but interlayer deformations are usually challenging to measure. Here, the authors exploit the strain-dependent optical properties of monolayer WSe2 to quantitatively probe the interlayer shear thermal deformations and interlayer cou...
| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Nature Portfolio
2022-07-01
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| Series: | Nature Communications |
| Online Access: | https://doi.org/10.1038/s41467-022-31682-w |
| _version_ | 1811323532799377408 |
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| author | Le Zhang Han Wang Xinrong Zong Yongheng Zhou Taihong Wang Lin Wang Xiaolong Chen |
| author_facet | Le Zhang Han Wang Xinrong Zong Yongheng Zhou Taihong Wang Lin Wang Xiaolong Chen |
| author_sort | Le Zhang |
| collection | DOAJ |
| description | Van der Waals materials exhibit unique thermomechanical properties, but interlayer deformations are usually challenging to measure. Here, the authors exploit the strain-dependent optical properties of monolayer WSe2 to quantitatively probe the interlayer shear thermal deformations and interlayer coupling in phosphorene and hexagonal boron nitride. |
| first_indexed | 2024-04-13T13:56:51Z |
| format | Article |
| id | doaj.art-9dcae2ba39f049e6921f8d6146e4a851 |
| institution | Directory Open Access Journal |
| issn | 2041-1723 |
| language | English |
| last_indexed | 2024-04-13T13:56:51Z |
| publishDate | 2022-07-01 |
| publisher | Nature Portfolio |
| record_format | Article |
| series | Nature Communications |
| spelling | doaj.art-9dcae2ba39f049e6921f8d6146e4a8512022-12-22T02:44:11ZengNature PortfolioNature Communications2041-17232022-07-011311810.1038/s41467-022-31682-wProbing interlayer shear thermal deformation in atomically-thin van der Waals layered materialsLe Zhang0Han Wang1Xinrong Zong2Yongheng Zhou3Taihong Wang4Lin Wang5Xiaolong Chen6Department of Electrical and Electronic Engineering, Southern University of Science and TechnologyDepartment of Electrical and Electronic Engineering, Southern University of Science and TechnologyKey Laboratory of Flexible Electronics (KLOFE) & Institute of Advanced Materials (IAM), Nanjing Tech University (Nanjing Tech)Department of Electrical and Electronic Engineering, Southern University of Science and TechnologyDepartment of Electrical and Electronic Engineering, Southern University of Science and TechnologyKey Laboratory of Flexible Electronics (KLOFE) & Institute of Advanced Materials (IAM), Nanjing Tech University (Nanjing Tech)Department of Electrical and Electronic Engineering, Southern University of Science and TechnologyVan der Waals materials exhibit unique thermomechanical properties, but interlayer deformations are usually challenging to measure. Here, the authors exploit the strain-dependent optical properties of monolayer WSe2 to quantitatively probe the interlayer shear thermal deformations and interlayer coupling in phosphorene and hexagonal boron nitride.https://doi.org/10.1038/s41467-022-31682-w |
| spellingShingle | Le Zhang Han Wang Xinrong Zong Yongheng Zhou Taihong Wang Lin Wang Xiaolong Chen Probing interlayer shear thermal deformation in atomically-thin van der Waals layered materials Nature Communications |
| title | Probing interlayer shear thermal deformation in atomically-thin van der Waals layered materials |
| title_full | Probing interlayer shear thermal deformation in atomically-thin van der Waals layered materials |
| title_fullStr | Probing interlayer shear thermal deformation in atomically-thin van der Waals layered materials |
| title_full_unstemmed | Probing interlayer shear thermal deformation in atomically-thin van der Waals layered materials |
| title_short | Probing interlayer shear thermal deformation in atomically-thin van der Waals layered materials |
| title_sort | probing interlayer shear thermal deformation in atomically thin van der waals layered materials |
| url | https://doi.org/10.1038/s41467-022-31682-w |
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