Dielectric dynamics of epitaxial BiFeO3 thin films
We report the detailed study on the low temperature dielectric dynamics of the epitaxial BiFeO3 thin films grown on Nb-doped SrTiO3 substrate. The results indicate that the contributions from the thin film dominate the dielectric response, although it comes from both the thin film and the electrode...
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Format: | Article |
Language: | English |
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AIP Publishing LLC
2012-06-01
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Series: | AIP Advances |
Online Access: | http://dx.doi.org/10.1063/1.4721670 |
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author | Peng Ren Peng Liu Bin Xia Xi Zou Lu You Junling Wang Lan Wang |
author_facet | Peng Ren Peng Liu Bin Xia Xi Zou Lu You Junling Wang Lan Wang |
author_sort | Peng Ren |
collection | DOAJ |
description | We report the detailed study on the low temperature dielectric dynamics of the epitaxial BiFeO3 thin films grown on Nb-doped SrTiO3 substrate. The results indicate that the contributions from the thin film dominate the dielectric response, although it comes from both the thin film and the electrode interface. Furthermore, the origins of the low temperature dielectric anomalies are investigated with electric circuit fittings. A possible phase transition at 210 K is revealed from analysis with dielectric loss tangent. The dielectric constants obtained from the constant phase elements (CPEs) are more than 400 even at low temperatures. Finally, the physical significances of the CPE model are discussed. |
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id | doaj.art-9ecedaaafb8f4c2b98d9f80a7edce951 |
institution | Directory Open Access Journal |
issn | 2158-3226 |
language | English |
last_indexed | 2024-12-21T22:21:01Z |
publishDate | 2012-06-01 |
publisher | AIP Publishing LLC |
record_format | Article |
series | AIP Advances |
spelling | doaj.art-9ecedaaafb8f4c2b98d9f80a7edce9512022-12-21T18:48:20ZengAIP Publishing LLCAIP Advances2158-32262012-06-0122022133022133-1210.1063/1.4721670033202ADVDielectric dynamics of epitaxial BiFeO3 thin filmsPeng Ren0Peng Liu1Bin Xia2Xi Zou3Lu You4Junling Wang5Lan Wang6Division of Physics and Applied Physics, School of Physical and Mathematical Sciences, Nanyang Technological University, SingaporeDivision of Physics and Applied Physics, School of Physical and Mathematical Sciences, Nanyang Technological University, SingaporeDivision of Physics and Applied Physics, School of Physical and Mathematical Sciences, Nanyang Technological University, SingaporeSchool of Materials Science and Engineering, Nanyang Technological University, Singapore 639798, SingaporeSchool of Materials Science and Engineering, Nanyang Technological University, Singapore 639798, SingaporeSchool of Materials Science and Engineering, Nanyang Technological University, Singapore 639798, SingaporeDivision of Physics and Applied Physics, School of Physical and Mathematical Sciences, Nanyang Technological University, SingaporeWe report the detailed study on the low temperature dielectric dynamics of the epitaxial BiFeO3 thin films grown on Nb-doped SrTiO3 substrate. The results indicate that the contributions from the thin film dominate the dielectric response, although it comes from both the thin film and the electrode interface. Furthermore, the origins of the low temperature dielectric anomalies are investigated with electric circuit fittings. A possible phase transition at 210 K is revealed from analysis with dielectric loss tangent. The dielectric constants obtained from the constant phase elements (CPEs) are more than 400 even at low temperatures. Finally, the physical significances of the CPE model are discussed.http://dx.doi.org/10.1063/1.4721670 |
spellingShingle | Peng Ren Peng Liu Bin Xia Xi Zou Lu You Junling Wang Lan Wang Dielectric dynamics of epitaxial BiFeO3 thin films AIP Advances |
title | Dielectric dynamics of epitaxial BiFeO3 thin films |
title_full | Dielectric dynamics of epitaxial BiFeO3 thin films |
title_fullStr | Dielectric dynamics of epitaxial BiFeO3 thin films |
title_full_unstemmed | Dielectric dynamics of epitaxial BiFeO3 thin films |
title_short | Dielectric dynamics of epitaxial BiFeO3 thin films |
title_sort | dielectric dynamics of epitaxial bifeo3 thin films |
url | http://dx.doi.org/10.1063/1.4721670 |
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