Dielectric dynamics of epitaxial BiFeO3 thin films

We report the detailed study on the low temperature dielectric dynamics of the epitaxial BiFeO3 thin films grown on Nb-doped SrTiO3 substrate. The results indicate that the contributions from the thin film dominate the dielectric response, although it comes from both the thin film and the electrode...

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Main Authors: Peng Ren, Peng Liu, Bin Xia, Xi Zou, Lu You, Junling Wang, Lan Wang
Format: Article
Language:English
Published: AIP Publishing LLC 2012-06-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/1.4721670
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author Peng Ren
Peng Liu
Bin Xia
Xi Zou
Lu You
Junling Wang
Lan Wang
author_facet Peng Ren
Peng Liu
Bin Xia
Xi Zou
Lu You
Junling Wang
Lan Wang
author_sort Peng Ren
collection DOAJ
description We report the detailed study on the low temperature dielectric dynamics of the epitaxial BiFeO3 thin films grown on Nb-doped SrTiO3 substrate. The results indicate that the contributions from the thin film dominate the dielectric response, although it comes from both the thin film and the electrode interface. Furthermore, the origins of the low temperature dielectric anomalies are investigated with electric circuit fittings. A possible phase transition at 210 K is revealed from analysis with dielectric loss tangent. The dielectric constants obtained from the constant phase elements (CPEs) are more than 400 even at low temperatures. Finally, the physical significances of the CPE model are discussed.
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spelling doaj.art-9ecedaaafb8f4c2b98d9f80a7edce9512022-12-21T18:48:20ZengAIP Publishing LLCAIP Advances2158-32262012-06-0122022133022133-1210.1063/1.4721670033202ADVDielectric dynamics of epitaxial BiFeO3 thin filmsPeng Ren0Peng Liu1Bin Xia2Xi Zou3Lu You4Junling Wang5Lan Wang6Division of Physics and Applied Physics, School of Physical and Mathematical Sciences, Nanyang Technological University, SingaporeDivision of Physics and Applied Physics, School of Physical and Mathematical Sciences, Nanyang Technological University, SingaporeDivision of Physics and Applied Physics, School of Physical and Mathematical Sciences, Nanyang Technological University, SingaporeSchool of Materials Science and Engineering, Nanyang Technological University, Singapore 639798, SingaporeSchool of Materials Science and Engineering, Nanyang Technological University, Singapore 639798, SingaporeSchool of Materials Science and Engineering, Nanyang Technological University, Singapore 639798, SingaporeDivision of Physics and Applied Physics, School of Physical and Mathematical Sciences, Nanyang Technological University, SingaporeWe report the detailed study on the low temperature dielectric dynamics of the epitaxial BiFeO3 thin films grown on Nb-doped SrTiO3 substrate. The results indicate that the contributions from the thin film dominate the dielectric response, although it comes from both the thin film and the electrode interface. Furthermore, the origins of the low temperature dielectric anomalies are investigated with electric circuit fittings. A possible phase transition at 210 K is revealed from analysis with dielectric loss tangent. The dielectric constants obtained from the constant phase elements (CPEs) are more than 400 even at low temperatures. Finally, the physical significances of the CPE model are discussed.http://dx.doi.org/10.1063/1.4721670
spellingShingle Peng Ren
Peng Liu
Bin Xia
Xi Zou
Lu You
Junling Wang
Lan Wang
Dielectric dynamics of epitaxial BiFeO3 thin films
AIP Advances
title Dielectric dynamics of epitaxial BiFeO3 thin films
title_full Dielectric dynamics of epitaxial BiFeO3 thin films
title_fullStr Dielectric dynamics of epitaxial BiFeO3 thin films
title_full_unstemmed Dielectric dynamics of epitaxial BiFeO3 thin films
title_short Dielectric dynamics of epitaxial BiFeO3 thin films
title_sort dielectric dynamics of epitaxial bifeo3 thin films
url http://dx.doi.org/10.1063/1.4721670
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AT luyou dielectricdynamicsofepitaxialbifeo3thinfilms
AT junlingwang dielectricdynamicsofepitaxialbifeo3thinfilms
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