An Improved Method for the Inversion of Backscatter Ionograms by Using Neighborhood-Aided and Multistep Fitting

An Improved Method for the Inversion of Backscatter Ionograms by Using Neighborhood-Aided and Multistep Fitting

To solve the problem that a parameter search easily falls into a local optimum and the two-dimensional electron density profile construction error is large in the process of backscatter ionogram inversion, an improved method using neighborhood-aided and multistep fitting is proposed. The ionospheric...

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Bibliographic Details
Main Authors: Zhenshuo Lei, Hui Chen, Zhaojian Zhang, Gaoqi Dou, Yongliang Wang
Format: Article
Language:English
Published: MDPI AG 2022-09-01
Series:Electronics
Subjects:
ionogram inversion
backscatter
genetic algorithm
ray tracing
Online Access:https://www.mdpi.com/2079-9292/11/17/2762

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