The El Niño Southern Oscillation Recharge Oscillator with the Stochastic Forcing of Long-Term Memory

The El Niño Southern Oscillation Recharge Oscillator with the Stochastic Forcing of Long-Term Memory

The influence of the fast-varying variables that have a long-term memory on the El Niño Southern Oscillation (ENSO) is investigated by adding a fractional Ornstein–Uhlenbeck (FOU) process stochastic noise on the simple recharge oscillator (RO) model. The FOU process noise converges to zero very slow...

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Bibliographic Details
Main Authors: Xiaofeng Li, Yaokun Li
Format: Article
Language:English
Published: MDPI AG 2024-02-01
Series:Fractal and Fractional
Subjects:
ENSO
the recharge oscillator model
stochastic noise
fractional Ornstein–Uhlenbeck process
fractional derivative
Online Access:https://www.mdpi.com/2504-3110/8/2/121

Internet

https://www.mdpi.com/2504-3110/8/2/121

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