Deposition of copper sulfide films on polyamide surface
In this paper, we present a novel and low - cost method for preparing copper sulfide films on polyamide. Non-treated as well as pre-treated PA6 films by 3 different methods (in boiled water; in NaOH solution; in boiled water and then in NaOH solution) were used for the formation of Cu2S lay...
| Main Authors: | , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
International Institute for the Science of Sintering, Beograd
2022-01-01
|
| Series: | Science of Sintering |
| Subjects: | |
| Online Access: | http://www.doiserbia.nb.rs/img/doi/0350-820X/2022/0350-820X2202139P.pdf |
| _version_ | 1818160679382679552 |
|---|---|
| author | Petrasauskiene Neringa Paluckiene Edita Alaburdaite Rasa Gilić Martina |
| author_facet | Petrasauskiene Neringa Paluckiene Edita Alaburdaite Rasa Gilić Martina |
| author_sort | Petrasauskiene Neringa |
| collection | DOAJ |
| description | In this paper, we present a novel and low - cost method for preparing copper
sulfide films on polyamide. Non-treated as well as pre-treated PA6 films by
3 different methods (in boiled water; in NaOH solution; in boiled water and
then in NaOH solution) were used for the formation of Cu2S layers by the
sorption-diffusion method. Molten sulfur has been used as a sulfurization
agent. The XRD, FTIR, and UV-VIS methods were used to characterize the
structural, optical, and electrical properties of samples and to track
changes in samples after each treatment stage. The sheet resistance of Cu2S
layers depends on the pre-treatment method and varied from 7 kΩ/sq to 6
MΩ/sq. The optical band gaps (Eg) for direct and indirect transitions are
determined to be 2.61-2.67 eV and 1.40-1.44 eV, respectively. Furthermore,
the optical constants n, k, and σ are determined from UV-VIS measurements. |
| first_indexed | 2024-12-11T16:05:43Z |
| format | Article |
| id | doaj.art-a065d087990d44d4bf16e7b3039e0c42 |
| institution | Directory Open Access Journal |
| issn | 0350-820X 1820-7413 |
| language | English |
| last_indexed | 2024-12-11T16:05:43Z |
| publishDate | 2022-01-01 |
| publisher | International Institute for the Science of Sintering, Beograd |
| record_format | Article |
| series | Science of Sintering |
| spelling | doaj.art-a065d087990d44d4bf16e7b3039e0c422022-12-22T00:59:12ZengInternational Institute for the Science of Sintering, BeogradScience of Sintering0350-820X1820-74132022-01-0154213915210.2298/SOS2202139P0350-820X2202139PDeposition of copper sulfide films on polyamide surfacePetrasauskiene Neringa0Paluckiene Edita1Alaburdaite Rasa2Gilić Martina3Department of Physical and Inorganic Chemistry, Kaunas University of Technology, Kaunas, LithuaniaDepartment of Physical and Inorganic Chemistry, Kaunas University of Technology, Kaunas, LithuaniaDepartment of Physical and Inorganic Chemistry, Kaunas University of Technology, Kaunas, LithuaniaInstitute of Physics Belgrade, University of Belgrade, Zemun, Serbia + Institut of Experimental Physics, Freie Universität Berlin, Berlin, GermanyIn this paper, we present a novel and low - cost method for preparing copper sulfide films on polyamide. Non-treated as well as pre-treated PA6 films by 3 different methods (in boiled water; in NaOH solution; in boiled water and then in NaOH solution) were used for the formation of Cu2S layers by the sorption-diffusion method. Molten sulfur has been used as a sulfurization agent. The XRD, FTIR, and UV-VIS methods were used to characterize the structural, optical, and electrical properties of samples and to track changes in samples after each treatment stage. The sheet resistance of Cu2S layers depends on the pre-treatment method and varied from 7 kΩ/sq to 6 MΩ/sq. The optical band gaps (Eg) for direct and indirect transitions are determined to be 2.61-2.67 eV and 1.40-1.44 eV, respectively. Furthermore, the optical constants n, k, and σ are determined from UV-VIS measurements.http://www.doiserbia.nb.rs/img/doi/0350-820X/2022/0350-820X2202139P.pdfthin filmcopper sulfidepolyamide 6x-ray diffractionoptical properties |
| spellingShingle | Petrasauskiene Neringa Paluckiene Edita Alaburdaite Rasa Gilić Martina Deposition of copper sulfide films on polyamide surface Science of Sintering thin film copper sulfide polyamide 6 x-ray diffraction optical properties |
| title | Deposition of copper sulfide films on polyamide surface |
| title_full | Deposition of copper sulfide films on polyamide surface |
| title_fullStr | Deposition of copper sulfide films on polyamide surface |
| title_full_unstemmed | Deposition of copper sulfide films on polyamide surface |
| title_short | Deposition of copper sulfide films on polyamide surface |
| title_sort | deposition of copper sulfide films on polyamide surface |
| topic | thin film copper sulfide polyamide 6 x-ray diffraction optical properties |
| url | http://www.doiserbia.nb.rs/img/doi/0350-820X/2022/0350-820X2202139P.pdf |
| work_keys_str_mv | AT petrasauskieneneringa depositionofcoppersulfidefilmsonpolyamidesurface AT paluckieneedita depositionofcoppersulfidefilmsonpolyamidesurface AT alaburdaiterasa depositionofcoppersulfidefilmsonpolyamidesurface AT gilicmartina depositionofcoppersulfidefilmsonpolyamidesurface |