Neural Network for Enhancing Microscopic Resolution Based on Images from Scanning Electron Microscope

In this paper, an artificial neural network is applied for enhancing the resolution of images from an optical microscope based on a network trained with the images acquired from a scanning electron microscope. The resolution of microscopic images is important in various fields, especially for microf...

Täydet tiedot

Bibliografiset tiedot
Päätekijät: Chia-Hung Dylan Tsai, Chia-Hao Yeh
Aineistotyyppi: Artikkeli
Kieli:English
Julkaistu: MDPI AG 2021-03-01
Sarja:Sensors
Aiheet:
Linkit:https://www.mdpi.com/1424-8220/21/6/2139