Four dimensional-scanning transmission electron microscopy study on relationship between crystallographic orientation and spontaneous polarization in epitaxial BiFeO3
Abstract Spontaneous polarization and crystallographic orientations within ferroelectric domains are investigated using an epitaxially grown BiFeO3 thin film under bi-axial tensile strain. Four dimensional-scanning transmission electron microscopy (4D-STEM) and atomic resolution STEM techniques reve...
| Main Authors: | , , |
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| 格式: | Article |
| 語言: | English |
| 出版: |
Nature Portfolio
2024-07-01
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| 叢編: | Scientific Reports |
| 在線閱讀: | https://doi.org/10.1038/s41598-024-66382-6 |