Multicolor single-analyzer high-energy-resolution XES spectrometer for simultaneous examination of different elements
The present work demonstrates the performance of a von Hámos high-energy-resolution X-ray spectrometer based on a non-conventional conical Si single-crystal analyzer. The analyzer is tested with different primary and secondary X-ray sources as well as a hard X-ray sensitive CCD camera. The spectrome...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
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International Union of Crystallography
2022-09-01
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| Series: | Journal of Synchrotron Radiation |
| Subjects: | |
| Online Access: | http://scripts.iucr.org/cgi-bin/paper?S1600577522007561 |
| _version_ | 1811209600559480832 |
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| author | Antal Mikeházi Jihad El Guettioui István B. Földes György Vankó Zoltán Németh |
| author_facet | Antal Mikeházi Jihad El Guettioui István B. Földes György Vankó Zoltán Németh |
| author_sort | Antal Mikeházi |
| collection | DOAJ |
| description | The present work demonstrates the performance of a von Hámos high-energy-resolution X-ray spectrometer based on a non-conventional conical Si single-crystal analyzer. The analyzer is tested with different primary and secondary X-ray sources as well as a hard X-ray sensitive CCD camera. The spectrometer setup is also characterized with ray-tracing simulations. Both experimental and simulated results affirm that the conical spectrometer can efficiently detect and resolve the two pairs of two elements (Ni and Cu) Kα X-ray emission spectroscopy (XES) peaks simultaneously, requiring a less than 2 cm-wide array on a single position-sensitive detector. The possible applications of this simple yet broad-energy-spectrum crystal spectrometer range from quickly adapting it as another probe for complex experiments at synchrotron beamlines to analyzing X-ray emission from plasma generated by ultrashort laser pulses at modern laser facilities. |
| first_indexed | 2024-04-12T04:41:28Z |
| format | Article |
| id | doaj.art-a0df752efc174245a79728de634c3c0b |
| institution | Directory Open Access Journal |
| issn | 1600-5775 |
| language | English |
| last_indexed | 2024-04-12T04:41:28Z |
| publishDate | 2022-09-01 |
| publisher | International Union of Crystallography |
| record_format | Article |
| series | Journal of Synchrotron Radiation |
| spelling | doaj.art-a0df752efc174245a79728de634c3c0b2022-12-22T03:47:36ZengInternational Union of CrystallographyJournal of Synchrotron Radiation1600-57752022-09-012951216122210.1107/S1600577522007561ok5073Multicolor single-analyzer high-energy-resolution XES spectrometer for simultaneous examination of different elementsAntal Mikeházi0Jihad El Guettioui1István B. Földes2György Vankó3Zoltán Németh4Wigner Research Centre for Physics, Konkoly Thege M. 29-33, 1121 Budapest, HungaryWigner Research Centre for Physics, Konkoly Thege M. 29-33, 1121 Budapest, HungaryWigner Research Centre for Physics, Konkoly Thege M. 29-33, 1121 Budapest, HungaryWigner Research Centre for Physics, Konkoly Thege M. 29-33, 1121 Budapest, HungaryWigner Research Centre for Physics, Konkoly Thege M. 29-33, 1121 Budapest, HungaryThe present work demonstrates the performance of a von Hámos high-energy-resolution X-ray spectrometer based on a non-conventional conical Si single-crystal analyzer. The analyzer is tested with different primary and secondary X-ray sources as well as a hard X-ray sensitive CCD camera. The spectrometer setup is also characterized with ray-tracing simulations. Both experimental and simulated results affirm that the conical spectrometer can efficiently detect and resolve the two pairs of two elements (Ni and Cu) Kα X-ray emission spectroscopy (XES) peaks simultaneously, requiring a less than 2 cm-wide array on a single position-sensitive detector. The possible applications of this simple yet broad-energy-spectrum crystal spectrometer range from quickly adapting it as another probe for complex experiments at synchrotron beamlines to analyzing X-ray emission from plasma generated by ultrashort laser pulses at modern laser facilities.http://scripts.iucr.org/cgi-bin/paper?S1600577522007561high-energy-resolution x-ray spectroscopiesvon hámos geometrylaser plasmaray tracingx-ray emission spectroscopy |
| spellingShingle | Antal Mikeházi Jihad El Guettioui István B. Földes György Vankó Zoltán Németh Multicolor single-analyzer high-energy-resolution XES spectrometer for simultaneous examination of different elements Journal of Synchrotron Radiation high-energy-resolution x-ray spectroscopies von hámos geometry laser plasma ray tracing x-ray emission spectroscopy |
| title | Multicolor single-analyzer high-energy-resolution XES spectrometer for simultaneous examination of different elements |
| title_full | Multicolor single-analyzer high-energy-resolution XES spectrometer for simultaneous examination of different elements |
| title_fullStr | Multicolor single-analyzer high-energy-resolution XES spectrometer for simultaneous examination of different elements |
| title_full_unstemmed | Multicolor single-analyzer high-energy-resolution XES spectrometer for simultaneous examination of different elements |
| title_short | Multicolor single-analyzer high-energy-resolution XES spectrometer for simultaneous examination of different elements |
| title_sort | multicolor single analyzer high energy resolution xes spectrometer for simultaneous examination of different elements |
| topic | high-energy-resolution x-ray spectroscopies von hámos geometry laser plasma ray tracing x-ray emission spectroscopy |
| url | http://scripts.iucr.org/cgi-bin/paper?S1600577522007561 |
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