Fast Dynamic IR-Drop Prediction Using Machine Learning in Bulk FinFET Technologies
IR-drop is a fundamental constraint by almost all integrated circuits (ICs) physical designs, and many iterations of timing engineer change order (ECO), IR-drop ECO, or other ECO are needed before design signoff. However, IR-drop analysis usually takes a long time and wastes so many resources. In th...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2021-09-01
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| Series: | Symmetry |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2073-8994/13/10/1807 |