Cita APA (7th ed.)

Sahu, P., Chen, J., & Wang, J. (2021). Charge trapping analysis in sputtered BixSe1-x based accumulation-mode FETs. II. Gate capacitance characteristics. AIP Publishing LLC.

Cita Chicago (17th ed.)

Sahu, Protyush, Jun-Yang Chen, i Jian-Ping Wang. Charge Trapping Analysis in Sputtered BixSe1-x Based Accumulation-mode FETs. II. Gate Capacitance Characteristics. AIP Publishing LLC, 2021.

Cita MLA (9th ed.)

Sahu, Protyush, et al. Charge Trapping Analysis in Sputtered BixSe1-x Based Accumulation-mode FETs. II. Gate Capacitance Characteristics. AIP Publishing LLC, 2021.