APA-ийн эшлэл(7 дахь хэвлэлт)

Sahu, P., Chen, J., & Wang, J. (2021). Charge trapping analysis in sputtered BixSe1-x based accumulation-mode FETs. II. Gate capacitance characteristics. AIP Publishing LLC.

Чикаго-гийн эшлэл (17 дахь хэвлэлт)

Sahu, Protyush, Jun-Yang Chen, ба Jian-Ping Wang. Charge Trapping Analysis in Sputtered BixSe1-x Based Accumulation-mode FETs. II. Gate Capacitance Characteristics. AIP Publishing LLC, 2021.

MLA -ийн эшлэл (9 дэх хэвлэлт)

Sahu, Protyush, et al. Charge Trapping Analysis in Sputtered BixSe1-x Based Accumulation-mode FETs. II. Gate Capacitance Characteristics. AIP Publishing LLC, 2021.