Voltage-induced Interface Reconstruction and Electrical Instability of the Ferromagnet-Semiconductor Device
Abstract Using x-ray magnetic spectroscopy with in-situ electrical characterizations, we investigated the effects of external voltage on the spin-electronic and transport properties at the interface of a Fe/ZnO device. Layer-, element-, and spin-resolved information of the device was obtained by cro...
| Prif Awduron: | , , , , , , |
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| Fformat: | Erthygl |
| Iaith: | English |
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Nature Portfolio
2017-03-01
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| Cyfres: | Scientific Reports |
| Mynediad Ar-lein: | https://doi.org/10.1038/s41598-017-00547-4 |