TEM Investigation of Asymmetric Deposition-Driven Crystalline-to-Amorphous Transition in Silicon Nanowires

TEM Investigation of Asymmetric Deposition-Driven Crystalline-to-Amorphous Transition in Silicon Nanowires

Controlling the shape and internal strain of nanowires (NWs) is critical for their safe and reliable use and for the exploration of novel functionalities of nanodevices. In this work, transmission electron microscopy was employed to examine bent Si NWs prepared by asymmetric electron-beam evaporatio...

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Bibliographic Details
Main Authors: Yuan Zang, Lianbi Li, Jichao Hu, Lei Li, Zelong Li, Zebin Li, Song Feng, Guoqing Zhang, Caijuan Xia, Hongbin Pu
Format: Article
Language:English
Published: MDPI AG 2022-10-01
Series:Materials
Subjects:
silicon nanowires
electron microscopy
phase transformation
bending
semiconductors
Online Access:https://www.mdpi.com/1996-1944/15/20/7077

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