In Situ Coherent X-ray Diffraction during Three-Point Bending of a Au Nanowire: Visualization and Quantification

In Situ Coherent X-ray Diffraction during Three-Point Bending of a Au Nanowire: Visualization and Quantification

The three-point bending behavior of a single Au nanowire deformed by an atomic force microscope was monitored by coherent X-ray diffraction using a sub-micrometer sized hard X-ray beam. Three-dimensional reciprocal-space maps were recorded before and after deformation by standard rocking curves and...

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Bibliographic Details
Main Authors: Anton Davydok, Thomas W. Cornelius, Zhe Ren, Cedric Leclere, Gilbert Chahine, Tobias Schülli, Florian Lauraux, Gunther Richter, Olivier Thomas
Format: Article
Language:English
Published: MDPI AG 2018-11-01
Series:Quantum Beam Science
Subjects:
synchrotron X-ray diffraction
nanostructures
nanomechanics
Online Access:https://www.mdpi.com/2412-382X/2/4/24

Internet

https://www.mdpi.com/2412-382X/2/4/24

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