Noise Properties Of Thick-Film Conducting Lines For Integrated Inductors
Studies of noise properties of thick-film conducting lines from Au or PdAg conductive pastes on LTCC or alumina substrates are reported. Experiments have been carried out at the room temperature on samples prepared in the form of meanders by traditional screen-printing or laser-shaping technique. Du...
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
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Polish Academy of Sciences
2015-06-01
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| Series: | Metrology and Measurement Systems |
| Subjects: | |
| Online Access: | http://www.degruyter.com/view/j/mms.2015.22.issue-2/mms-2015-0021/mms-2015-0021.xml?format=INT |
| _version_ | 1818350999565238272 |
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| author | Stadler Adam Witold Kolek Andrzej Mleczko Krzysztof Zawiślak Zbigniew Dziedzic Andrzej Nowak Damian |
| author_facet | Stadler Adam Witold Kolek Andrzej Mleczko Krzysztof Zawiślak Zbigniew Dziedzic Andrzej Nowak Damian |
| author_sort | Stadler Adam Witold |
| collection | DOAJ |
| description | Studies of noise properties of thick-film conducting lines from Au or PdAg conductive pastes on LTCC or alumina substrates are reported. Experiments have been carried out at the room temperature on samples prepared in the form of meanders by traditional screen-printing or laser-shaping technique. Due to a low resistance of the devices under test (DUTs), low-frequency noise spectra have been measured for the dc-biased samples arranged in a bridge configuration, transformer-coupled to a low-noise amplifier. The detailed analysis of noise sources in the signal path and its transfer function, including the transformer, has been carried out, and a procedure for measurement setup self-calibration has been described. The 1/f noise component originating from resistance fluctuations has been found to be dominant in all DUTs. The analysis of experimental data leads to the conclusion that noise is produced in the bends of meanders rather than in their straight segments. It occurs that noise of Au-based laser-shaped lines is significantly smaller than screen-printed ones. PdAg lines have been found more resistive but simultaneously less noisy than Au-based lines. |
| first_indexed | 2024-12-13T18:30:46Z |
| format | Article |
| id | doaj.art-a2983ab88d5d43288d07d18daffaf3a3 |
| institution | Directory Open Access Journal |
| issn | 2300-1941 |
| language | English |
| last_indexed | 2024-12-13T18:30:46Z |
| publishDate | 2015-06-01 |
| publisher | Polish Academy of Sciences |
| record_format | Article |
| series | Metrology and Measurement Systems |
| spelling | doaj.art-a2983ab88d5d43288d07d18daffaf3a32022-12-21T23:35:30ZengPolish Academy of SciencesMetrology and Measurement Systems2300-19412015-06-0122222924010.1515/mms-2015-0021mms-2015-0021Noise Properties Of Thick-Film Conducting Lines For Integrated InductorsStadler Adam Witold0Kolek Andrzej1Mleczko Krzysztof2Zawiślak Zbigniew3Dziedzic Andrzej4Nowak Damian5Rzeszów University of Technology, Department of Electronics Fundamentals, Powstańców Warszawy 12, 35-959 Rzeszów, PolandRzeszów University of Technology, Department of Electronics Fundamentals, Powstańców Warszawy 12, 35-959 Rzeszów, PolandRzeszów University of Technology, Department of Electronics Fundamentals, Powstańców Warszawy 12, 35-959 Rzeszów, PolandRzeszów University of Technology, Department of Electronics Fundamentals, Powstańców Warszawy 12, 35-959 Rzeszów, PolandWrocław University of Technology, Faculty of Microsystem Electronics and Photonics, Wybrzeże Wyspiańskiego 27, 50-370 Wrocław, PolandWrocław University of Technology, Faculty of Microsystem Electronics and Photonics, Wybrzeże Wyspiańskiego 27, 50-370 Wrocław, PolandStudies of noise properties of thick-film conducting lines from Au or PdAg conductive pastes on LTCC or alumina substrates are reported. Experiments have been carried out at the room temperature on samples prepared in the form of meanders by traditional screen-printing or laser-shaping technique. Due to a low resistance of the devices under test (DUTs), low-frequency noise spectra have been measured for the dc-biased samples arranged in a bridge configuration, transformer-coupled to a low-noise amplifier. The detailed analysis of noise sources in the signal path and its transfer function, including the transformer, has been carried out, and a procedure for measurement setup self-calibration has been described. The 1/f noise component originating from resistance fluctuations has been found to be dominant in all DUTs. The analysis of experimental data leads to the conclusion that noise is produced in the bends of meanders rather than in their straight segments. It occurs that noise of Au-based laser-shaped lines is significantly smaller than screen-printed ones. PdAg lines have been found more resistive but simultaneously less noisy than Au-based lines.http://www.degruyter.com/view/j/mms.2015.22.issue-2/mms-2015-0021/mms-2015-0021.xml?format=INTlow-frequency noisethick-film conducting layerthick-film inductor |
| spellingShingle | Stadler Adam Witold Kolek Andrzej Mleczko Krzysztof Zawiślak Zbigniew Dziedzic Andrzej Nowak Damian Noise Properties Of Thick-Film Conducting Lines For Integrated Inductors Metrology and Measurement Systems low-frequency noise thick-film conducting layer thick-film inductor |
| title | Noise Properties Of Thick-Film Conducting Lines For Integrated Inductors |
| title_full | Noise Properties Of Thick-Film Conducting Lines For Integrated Inductors |
| title_fullStr | Noise Properties Of Thick-Film Conducting Lines For Integrated Inductors |
| title_full_unstemmed | Noise Properties Of Thick-Film Conducting Lines For Integrated Inductors |
| title_short | Noise Properties Of Thick-Film Conducting Lines For Integrated Inductors |
| title_sort | noise properties of thick film conducting lines for integrated inductors |
| topic | low-frequency noise thick-film conducting layer thick-film inductor |
| url | http://www.degruyter.com/view/j/mms.2015.22.issue-2/mms-2015-0021/mms-2015-0021.xml?format=INT |
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