Limitations to Electrical Probing of Spontaneous Polarization in Ferroelectric-Dielectric Heterostructures
An accurate estimate of the ferroelectric polarization in ferroelectric-dielectric stacks is important from a materials science perspective, and it is also crucial for the development of ferroelectric based electron devices. This paper revisits the theory and application of the PUND technique in Met...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
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IEEE
2022-01-01
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| Series: | IEEE Journal of the Electron Devices Society |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/9754361/ |
| _version_ | 1818188738369421312 |
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| author | Mattia Segatto Riccardo Fontanini Francesco Driussi Daniel Lizzit David Esseni |
| author_facet | Mattia Segatto Riccardo Fontanini Francesco Driussi Daniel Lizzit David Esseni |
| author_sort | Mattia Segatto |
| collection | DOAJ |
| description | An accurate estimate of the ferroelectric polarization in ferroelectric-dielectric stacks is important from a materials science perspective, and it is also crucial for the development of ferroelectric based electron devices. This paper revisits the theory and application of the PUND technique in Metal-Ferroelectric-Dielectric-Metal (MFDM) structures by using analytical derivations and numerical simulations. In an MFDM structure the results of the PUND technique may largely differ from the polarization actually switched in the stack, which in turn is different from the remnant polarization of the underlying ferroelectric. The main hindrances that prevent PUND measurements from providing a good estimate of the polarization switching in MFDM stacks are thus discussed. The inspection of the involved physical quantities, not always accessible in experiments, provides a useful insight about the main sources of the errors in the PUND technique, and clarifies the delicate interplay between the depolarization field and the charge injection and trapping in MFDM stacks with a thin dielectric layer. |
| first_indexed | 2024-12-11T23:31:42Z |
| format | Article |
| id | doaj.art-a306f22c7ffc44e4b50cf6dfde8d42f3 |
| institution | Directory Open Access Journal |
| issn | 2168-6734 |
| language | English |
| last_indexed | 2024-12-11T23:31:42Z |
| publishDate | 2022-01-01 |
| publisher | IEEE |
| record_format | Article |
| series | IEEE Journal of the Electron Devices Society |
| spelling | doaj.art-a306f22c7ffc44e4b50cf6dfde8d42f32022-12-22T00:46:01ZengIEEEIEEE Journal of the Electron Devices Society2168-67342022-01-011032433310.1109/JEDS.2022.31646529754361Limitations to Electrical Probing of Spontaneous Polarization in Ferroelectric-Dielectric HeterostructuresMattia Segatto0https://orcid.org/0000-0002-0091-1862Riccardo Fontanini1https://orcid.org/0000-0002-4246-946XFrancesco Driussi2https://orcid.org/0000-0003-2175-6977Daniel Lizzit3https://orcid.org/0000-0002-5243-5888David Esseni4https://orcid.org/0000-0002-3468-5197Department of DPIA, University of Udine, Udine, ItalyDepartment of DPIA, University of Udine, Udine, ItalyDepartment of DPIA, University of Udine, Udine, ItalyDepartment of DPIA, University of Udine, Udine, ItalyDepartment of DPIA, University of Udine, Udine, ItalyAn accurate estimate of the ferroelectric polarization in ferroelectric-dielectric stacks is important from a materials science perspective, and it is also crucial for the development of ferroelectric based electron devices. This paper revisits the theory and application of the PUND technique in Metal-Ferroelectric-Dielectric-Metal (MFDM) structures by using analytical derivations and numerical simulations. In an MFDM structure the results of the PUND technique may largely differ from the polarization actually switched in the stack, which in turn is different from the remnant polarization of the underlying ferroelectric. The main hindrances that prevent PUND measurements from providing a good estimate of the polarization switching in MFDM stacks are thus discussed. The inspection of the involved physical quantities, not always accessible in experiments, provides a useful insight about the main sources of the errors in the PUND technique, and clarifies the delicate interplay between the depolarization field and the charge injection and trapping in MFDM stacks with a thin dielectric layer.https://ieeexplore.ieee.org/document/9754361/HZOferroelectricMFDMdielectricPUNDdepolarization |
| spellingShingle | Mattia Segatto Riccardo Fontanini Francesco Driussi Daniel Lizzit David Esseni Limitations to Electrical Probing of Spontaneous Polarization in Ferroelectric-Dielectric Heterostructures IEEE Journal of the Electron Devices Society HZO ferroelectric MFDM dielectric PUND depolarization |
| title | Limitations to Electrical Probing of Spontaneous Polarization in Ferroelectric-Dielectric Heterostructures |
| title_full | Limitations to Electrical Probing of Spontaneous Polarization in Ferroelectric-Dielectric Heterostructures |
| title_fullStr | Limitations to Electrical Probing of Spontaneous Polarization in Ferroelectric-Dielectric Heterostructures |
| title_full_unstemmed | Limitations to Electrical Probing of Spontaneous Polarization in Ferroelectric-Dielectric Heterostructures |
| title_short | Limitations to Electrical Probing of Spontaneous Polarization in Ferroelectric-Dielectric Heterostructures |
| title_sort | limitations to electrical probing of spontaneous polarization in ferroelectric dielectric heterostructures |
| topic | HZO ferroelectric MFDM dielectric PUND depolarization |
| url | https://ieeexplore.ieee.org/document/9754361/ |
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