Hybrid Segmentation Approach for Digital Circuits in Pseudo Exhaustive Testing

In the pseudo-exhaustive testing, the main hardware cost is based on inserting required segmentation cells to properly segment digital circuits. In this paper, the efficient hybrid approach to segment digital circuits is presented for segmentation cell reduction. This approach can adapt different to...

Full description

Bibliographic Details
Main Authors: Mohamed H. El-Mahlawy, Winston Waller
Format: Article
Language:English
Published: Editura Universităţii din Oradea 2021-10-01
Series:Journal of Electrical and Electronics Engineering
Subjects:
Online Access:http://electroinf.uoradea.ro/images/articles/CERCETARE/Reviste/JEEE/JEEE_V14_N2_OCT_2021/5%20JEEE%20Mohamed%20H.%20El-Mahlawy.pdf
_version_ 1811157485067698176
author Mohamed H. El-Mahlawy
Winston Waller
author_facet Mohamed H. El-Mahlawy
Winston Waller
author_sort Mohamed H. El-Mahlawy
collection DOAJ
description In the pseudo-exhaustive testing, the main hardware cost is based on inserting required segmentation cells to properly segment digital circuits. In this paper, the efficient hybrid approach to segment digital circuits is presented for segmentation cell reduction. This approach can adapt different topologies of digital circuits using several heuristic procedures. It is mainly based on the hybrid selection of candidate nodes that segmentation cells are inserted after them. In addition, the adapted global, limited global, and local effects used in the hybrid heuristic procedures evaluate the effect of candidate nodes with respect to particular nodes in their fan-out cone. The hybrid segmentation approach (HSA) is compared with all previously published approaches using the benchmark circuits. The best results illustrate the superiority of the HSA presented in this paper. In addition, the HSA has linear relationship between the number of segmentation cells and the values of the cone size reduction between 16 and 32 for all benchmark circuits, considered the added enhancement over the other previously approaches.
first_indexed 2024-04-10T05:08:28Z
format Article
id doaj.art-a389cbefe1034a38b338c292b48c4fc1
institution Directory Open Access Journal
issn 1844-6035
2067-2128
language English
last_indexed 2024-04-10T05:08:28Z
publishDate 2021-10-01
publisher Editura Universităţii din Oradea
record_format Article
series Journal of Electrical and Electronics Engineering
spelling doaj.art-a389cbefe1034a38b338c292b48c4fc12023-03-09T11:18:10ZengEditura Universităţii din OradeaJournal of Electrical and Electronics Engineering1844-60352067-21282021-10-011423142Hybrid Segmentation Approach for Digital Circuits in Pseudo Exhaustive TestingMohamed H. El-Mahlawy0Winston Waller1Future University in Egypt, EgyptUniversity of Kent, Canterbury, United KingdomIn the pseudo-exhaustive testing, the main hardware cost is based on inserting required segmentation cells to properly segment digital circuits. In this paper, the efficient hybrid approach to segment digital circuits is presented for segmentation cell reduction. This approach can adapt different topologies of digital circuits using several heuristic procedures. It is mainly based on the hybrid selection of candidate nodes that segmentation cells are inserted after them. In addition, the adapted global, limited global, and local effects used in the hybrid heuristic procedures evaluate the effect of candidate nodes with respect to particular nodes in their fan-out cone. The hybrid segmentation approach (HSA) is compared with all previously published approaches using the benchmark circuits. The best results illustrate the superiority of the HSA presented in this paper. In addition, the HSA has linear relationship between the number of segmentation cells and the values of the cone size reduction between 16 and 32 for all benchmark circuits, considered the added enhancement over the other previously approaches.http://electroinf.uoradea.ro/images/articles/CERCETARE/Reviste/JEEE/JEEE_V14_N2_OCT_2021/5%20JEEE%20Mohamed%20H.%20El-Mahlawy.pdfsegmentations of digital circuitspartitioning of digital circuitsdesign for testability of digital vlsi circuitspseudo-exhaustive testing
spellingShingle Mohamed H. El-Mahlawy
Winston Waller
Hybrid Segmentation Approach for Digital Circuits in Pseudo Exhaustive Testing
Journal of Electrical and Electronics Engineering
segmentations of digital circuits
partitioning of digital circuits
design for testability of digital vlsi circuits
pseudo-exhaustive testing
title Hybrid Segmentation Approach for Digital Circuits in Pseudo Exhaustive Testing
title_full Hybrid Segmentation Approach for Digital Circuits in Pseudo Exhaustive Testing
title_fullStr Hybrid Segmentation Approach for Digital Circuits in Pseudo Exhaustive Testing
title_full_unstemmed Hybrid Segmentation Approach for Digital Circuits in Pseudo Exhaustive Testing
title_short Hybrid Segmentation Approach for Digital Circuits in Pseudo Exhaustive Testing
title_sort hybrid segmentation approach for digital circuits in pseudo exhaustive testing
topic segmentations of digital circuits
partitioning of digital circuits
design for testability of digital vlsi circuits
pseudo-exhaustive testing
url http://electroinf.uoradea.ro/images/articles/CERCETARE/Reviste/JEEE/JEEE_V14_N2_OCT_2021/5%20JEEE%20Mohamed%20H.%20El-Mahlawy.pdf
work_keys_str_mv AT mohamedhelmahlawy hybridsegmentationapproachfordigitalcircuitsinpseudoexhaustivetesting
AT winstonwaller hybridsegmentationapproachfordigitalcircuitsinpseudoexhaustivetesting