Atomistic understanding of the variable nano-hardness of C-plane sapphire considering the crystal anisotropy
Nanoindentation test method is widely used to measure the material hardness, which is a standard test and the effect of measurement error is limited. However, the measured results of the nano-hardness for the same plane of single crystal materials, such as sapphire, were very different. The possible...
Main Authors: | Tian Qiu, Feng Jiang, Ningchang Wang, Jiaming Lin, Zige Tian, Yueqin Wu, Qiuling Wen, Jing Lu |
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Format: | Article |
Language: | English |
Published: |
Elsevier
2024-03-01
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Series: | Journal of Materials Research and Technology |
Subjects: | |
Online Access: | http://www.sciencedirect.com/science/article/pii/S2238785424004563 |
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