A Secure Scan Architecture Protecting Scan Test and Scan Dump Using Skew-Based Lock and Key
Scan-based Design for Testability (DFT) is widely used in industry as it consistently provides high fault coverage. However, scan-based DFT is prone to security vulnerabilities where attackers use the scan design to obtain secret information from the system-on-chip. Existing countermeasures for such...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2021-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/9486853/ |