Analysis of Secondary Particles as a Complement to Muon Scattering Measurements

Cosmic ray tomography is an emerging imaging technique utilizing an ambient source of radiation. One common tomography method is based on the measurement of muons scattered by the examined objects, which allows the reconstruction and discrimination of materials with different properties. From the in...

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Main Authors: Maximilian Pérez Prada, Sarah Barnes, Maurice Stephan
Format: Article
Language:English
Published: MDPI AG 2022-10-01
Series:Instruments
Subjects:
Online Access:https://www.mdpi.com/2410-390X/6/4/66
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author Maximilian Pérez Prada
Sarah Barnes
Maurice Stephan
author_facet Maximilian Pérez Prada
Sarah Barnes
Maurice Stephan
author_sort Maximilian Pérez Prada
collection DOAJ
description Cosmic ray tomography is an emerging imaging technique utilizing an ambient source of radiation. One common tomography method is based on the measurement of muons scattered by the examined objects, which allows the reconstruction and discrimination of materials with different properties. From the interaction of air shower particles induced through cosmic rays with the material to be scanned, secondary particles, predominantly photons, neutrons and electrons, can be produced, which carry complementary information about the objects and their materials. However, this information is currently not fully exploited or only studied in coincidence with the incoming air shower particles. Therefore, this work presents a novel approach utilizing only the information from secondary particles to reconstruct and discriminate objects made out of a variety of materials. It also includes a detailed analysis of the kinematics of secondary particles and their dependency on material characteristics. In addition, a reconstruction algorithm to produce 3D maps of the examined volume from the measurement of secondary particles is introduced. This results in a successful reconstruction and differentiation of objects in various geometrical compositions.
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spelling doaj.art-a3fcb06c87684e4db05ec456fd1929df2023-12-03T14:53:19ZengMDPI AGInstruments2410-390X2022-10-01646610.3390/instruments6040066Analysis of Secondary Particles as a Complement to Muon Scattering MeasurementsMaximilian Pérez Prada0Sarah Barnes1Maurice Stephan2German Aerospace Center (DLR), Institute for the Protection of Maritime Infrastructures, Fischkai 1, 27572 Bremerhaven, GermanyGerman Aerospace Center (DLR), Institute for the Protection of Maritime Infrastructures, Fischkai 1, 27572 Bremerhaven, GermanyGerman Aerospace Center (DLR), Institute for the Protection of Maritime Infrastructures, Fischkai 1, 27572 Bremerhaven, GermanyCosmic ray tomography is an emerging imaging technique utilizing an ambient source of radiation. One common tomography method is based on the measurement of muons scattered by the examined objects, which allows the reconstruction and discrimination of materials with different properties. From the interaction of air shower particles induced through cosmic rays with the material to be scanned, secondary particles, predominantly photons, neutrons and electrons, can be produced, which carry complementary information about the objects and their materials. However, this information is currently not fully exploited or only studied in coincidence with the incoming air shower particles. Therefore, this work presents a novel approach utilizing only the information from secondary particles to reconstruct and discriminate objects made out of a variety of materials. It also includes a detailed analysis of the kinematics of secondary particles and their dependency on material characteristics. In addition, a reconstruction algorithm to produce 3D maps of the examined volume from the measurement of secondary particles is introduced. This results in a successful reconstruction and differentiation of objects in various geometrical compositions.https://www.mdpi.com/2410-390X/6/4/66cosmic raystomographysecondary particleshipping container
spellingShingle Maximilian Pérez Prada
Sarah Barnes
Maurice Stephan
Analysis of Secondary Particles as a Complement to Muon Scattering Measurements
Instruments
cosmic rays
tomography
secondary particle
shipping container
title Analysis of Secondary Particles as a Complement to Muon Scattering Measurements
title_full Analysis of Secondary Particles as a Complement to Muon Scattering Measurements
title_fullStr Analysis of Secondary Particles as a Complement to Muon Scattering Measurements
title_full_unstemmed Analysis of Secondary Particles as a Complement to Muon Scattering Measurements
title_short Analysis of Secondary Particles as a Complement to Muon Scattering Measurements
title_sort analysis of secondary particles as a complement to muon scattering measurements
topic cosmic rays
tomography
secondary particle
shipping container
url https://www.mdpi.com/2410-390X/6/4/66
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AT sarahbarnes analysisofsecondaryparticlesasacomplementtomuonscatteringmeasurements
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