Aluminum Concentration Drives the Structural Evolution of Magnetron Sputtering (Ti, Al) C Thin Film

The effect of deposited Al on the structural evolution of TiC films with a chemical composition variation has investigated during combinatorial magnetron sputtering of binary ceramic (Ti, Al) C. The here produced thin films have been investigated by energy dispersive X-ray spectroscopy (EDX) and X-r...

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Bibliographic Details
Main Author: A. Al-Ghaban
Format: Article
Language:English
Published: Unviversity of Technology- Iraq 2018-01-01
Series:Engineering and Technology Journal
Subjects:
Online Access:https://etj.uotechnology.edu.iq/article_136777_3e2727297535d3a3e56828af383d954b.pdf

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