Surface topologies of thin aluminum films and absorbing properties of metal dielectric structures in the microwave range
The paper presents experimental and theoretical results on the surface topography of thin aluminum films. The ambiguous topology dynamics of the thin-film structure is represented as a function of the increase in the bulk mass of the deposited material, which leads to an occasional rise in roughness...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
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EDP Sciences
2019-01-01
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| Series: | ITM Web of Conferences |
| Online Access: | https://www.itm-conferences.org/articles/itmconf/pdf/2019/07/itmconf_crimico2019_08013.pdf |
| _version_ | 1818618104340545536 |
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| author | Fitaev Ibraim Shevketovich Orlenson Vulf Borisrvich Romanets Yuri Viktorovich Mazinov Alim Seit-Ametovich |
| author_facet | Fitaev Ibraim Shevketovich Orlenson Vulf Borisrvich Romanets Yuri Viktorovich Mazinov Alim Seit-Ametovich |
| author_sort | Fitaev Ibraim Shevketovich |
| collection | DOAJ |
| description | The paper presents experimental and theoretical results on the surface topography of thin aluminum films. The ambiguous topology dynamics of the thin-film structure is represented as a function of the increase in the bulk mass of the deposited material, which leads to an occasional rise in roughness reaching its maximum at a film thickness of 7 nm. At same time on the same thickness of the conductive layer the maximum of the absorption coefficient variability is observed. A theoretical analysis of the optical coefficients depending on the size of the conductive film substantiated the existence of extremes, but at smaller thicknesses. |
| first_indexed | 2024-12-16T17:16:17Z |
| format | Article |
| id | doaj.art-a43cca957ab640f8aaf3f83394c6063a |
| institution | Directory Open Access Journal |
| issn | 2271-2097 |
| language | English |
| last_indexed | 2024-12-16T17:16:17Z |
| publishDate | 2019-01-01 |
| publisher | EDP Sciences |
| record_format | Article |
| series | ITM Web of Conferences |
| spelling | doaj.art-a43cca957ab640f8aaf3f83394c6063a2022-12-21T22:23:17ZengEDP SciencesITM Web of Conferences2271-20972019-01-01300801310.1051/itmconf/20193008013itmconf_crimico2019_08013Surface topologies of thin aluminum films and absorbing properties of metal dielectric structures in the microwave rangeFitaev Ibraim ShevketovichOrlenson Vulf BorisrvichRomanets Yuri ViktorovichMazinov Alim Seit-AmetovichThe paper presents experimental and theoretical results on the surface topography of thin aluminum films. The ambiguous topology dynamics of the thin-film structure is represented as a function of the increase in the bulk mass of the deposited material, which leads to an occasional rise in roughness reaching its maximum at a film thickness of 7 nm. At same time on the same thickness of the conductive layer the maximum of the absorption coefficient variability is observed. A theoretical analysis of the optical coefficients depending on the size of the conductive film substantiated the existence of extremes, but at smaller thicknesses.https://www.itm-conferences.org/articles/itmconf/pdf/2019/07/itmconf_crimico2019_08013.pdf |
| spellingShingle | Fitaev Ibraim Shevketovich Orlenson Vulf Borisrvich Romanets Yuri Viktorovich Mazinov Alim Seit-Ametovich Surface topologies of thin aluminum films and absorbing properties of metal dielectric structures in the microwave range ITM Web of Conferences |
| title | Surface topologies of thin aluminum films and absorbing properties of metal dielectric structures in the microwave range |
| title_full | Surface topologies of thin aluminum films and absorbing properties of metal dielectric structures in the microwave range |
| title_fullStr | Surface topologies of thin aluminum films and absorbing properties of metal dielectric structures in the microwave range |
| title_full_unstemmed | Surface topologies of thin aluminum films and absorbing properties of metal dielectric structures in the microwave range |
| title_short | Surface topologies of thin aluminum films and absorbing properties of metal dielectric structures in the microwave range |
| title_sort | surface topologies of thin aluminum films and absorbing properties of metal dielectric structures in the microwave range |
| url | https://www.itm-conferences.org/articles/itmconf/pdf/2019/07/itmconf_crimico2019_08013.pdf |
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