Terahertz characterization of two-dimensional low-conductive layers enabled by metal gratings

Abstract While terahertz spectroscopy can provide valuable information regarding the charge transport properties in semiconductors, its application for the characterization of low-conductive two-dimensional layers, i.e., σs <  < 1 mS, remains elusive. This is primarily due to the low sensitivi...

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Main Authors: Prashanth Gopalan, Yunshan Wang, Berardi Sensale-Rodriguez
Format: Article
Language:English
Published: Nature Portfolio 2021-02-01
Series:Scientific Reports
Online Access:https://doi.org/10.1038/s41598-021-82560-2
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author Prashanth Gopalan
Yunshan Wang
Berardi Sensale-Rodriguez
author_facet Prashanth Gopalan
Yunshan Wang
Berardi Sensale-Rodriguez
author_sort Prashanth Gopalan
collection DOAJ
description Abstract While terahertz spectroscopy can provide valuable information regarding the charge transport properties in semiconductors, its application for the characterization of low-conductive two-dimensional layers, i.e., σs <  < 1 mS, remains elusive. This is primarily due to the low sensitivity of direct transmission measurements to such small sheet conductivity levels. In this work, we discuss harnessing the extraordinary optical transmission through gratings consisting of metallic stripes to characterize such low-conductive two-dimensional layers. We analyze the geometric tradeoffs in these structures and provide physical insights, ultimately leading to general design guidelines for experiments enabling non-contact, non-destructive, highly sensitive characterization of such layers.
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spelling doaj.art-a4589a3ccd4441cdb73ecf0f820034032022-12-21T22:56:24ZengNature PortfolioScientific Reports2045-23222021-02-0111111010.1038/s41598-021-82560-2Terahertz characterization of two-dimensional low-conductive layers enabled by metal gratingsPrashanth Gopalan0Yunshan Wang1Berardi Sensale-Rodriguez2Department of Electrical and Computer Engineering, The University of UtahDepartment of Chemical Engineering, The University of UtahDepartment of Electrical and Computer Engineering, The University of UtahAbstract While terahertz spectroscopy can provide valuable information regarding the charge transport properties in semiconductors, its application for the characterization of low-conductive two-dimensional layers, i.e., σs <  < 1 mS, remains elusive. This is primarily due to the low sensitivity of direct transmission measurements to such small sheet conductivity levels. In this work, we discuss harnessing the extraordinary optical transmission through gratings consisting of metallic stripes to characterize such low-conductive two-dimensional layers. We analyze the geometric tradeoffs in these structures and provide physical insights, ultimately leading to general design guidelines for experiments enabling non-contact, non-destructive, highly sensitive characterization of such layers.https://doi.org/10.1038/s41598-021-82560-2
spellingShingle Prashanth Gopalan
Yunshan Wang
Berardi Sensale-Rodriguez
Terahertz characterization of two-dimensional low-conductive layers enabled by metal gratings
Scientific Reports
title Terahertz characterization of two-dimensional low-conductive layers enabled by metal gratings
title_full Terahertz characterization of two-dimensional low-conductive layers enabled by metal gratings
title_fullStr Terahertz characterization of two-dimensional low-conductive layers enabled by metal gratings
title_full_unstemmed Terahertz characterization of two-dimensional low-conductive layers enabled by metal gratings
title_short Terahertz characterization of two-dimensional low-conductive layers enabled by metal gratings
title_sort terahertz characterization of two dimensional low conductive layers enabled by metal gratings
url https://doi.org/10.1038/s41598-021-82560-2
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AT berardisensalerodriguez terahertzcharacterizationoftwodimensionallowconductivelayersenabledbymetalgratings