A Machine-Learning Strategy to Detect Mura Defects in a Low-Contrast Image by Piecewise Gamma Correction

A Machine-Learning Strategy to Detect Mura Defects in a Low-Contrast Image by Piecewise Gamma Correction

A detection and classification machine-learning model to inspect Thin Film Transistor Liquid Crystal Display (TFT-LCD) Mura is proposed in this study. To improve the capability of the machine-learning model to inspect panels’ low-contrast grayscale images, piecewise gamma correction and a Selective...

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Bibliographic Details
Main Authors: Zo-Han Lin, Qi-Yuan Lai, Hung-Yuan Li
Format: Article
Language:English
Published: MDPI AG 2024-02-01
Series:Sensors
Subjects:
machine-learning
display panel
Mura detection and classification
APSO
CNN
Online Access:https://www.mdpi.com/1424-8220/24/5/1484

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