A Brewster incidence method for shocked dynamic metrology of transparent materials and its error evaluation
The shock etalon method with normal incidence is an effective method to extract the shocked dynamic parameters of transparent materials. In order to eliminate the sample surface reflection, additional efforts on the sample preparation are usually introduced, which may limit the application of the me...
| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2020-10-01
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| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/5.0023819 |