A Deep Multi-Label Learning Framework for the Intelligent Fault Diagnosis of Machines
Deep learning has been applied in intelligent fault diagnosis of machines since it trains deep neural networks to simultaneously learn features and recognize faults. In the intelligent fault diagnosis methods based on deep learning, feature learning and fault recognition are achieved by solving a mu...
Main Authors: | Jianjun Shen, Shihao Li, Feng Jia, Hao Zuo, Junxing Ma |
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Format: | Article |
Language: | English |
Published: |
IEEE
2020-01-01
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Series: | IEEE Access |
Subjects: | |
Online Access: | https://ieeexplore.ieee.org/document/9118881/ |
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