A New Method for Lift-off of III-Nitride Semiconductors for Heterogeneous Integration

<p>Abstract</p> <p>The release and transfer of GaN epilayers to other substrates is of interest for a variety of applications, including heterogeneous integration of silicon logic devices, III&#8211;V power devices and optical devices. We have developed a simple wet chemical et...

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Main Authors: Zang KeYan, Cheong DavyWC, Liu HongFei, Liu Hong, Teng JingHua, Chua SooJin
Format: Article
Language:English
Published: SpringerOpen 2010-01-01
Series:Nanoscale Research Letters
Subjects:
Online Access:http://dx.doi.org/10.1007/s11671-010-9601-6
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author Zang KeYan
Cheong DavyWC
Liu HongFei
Liu Hong
Teng JingHua
Chua SooJin
author_facet Zang KeYan
Cheong DavyWC
Liu HongFei
Liu Hong
Teng JingHua
Chua SooJin
author_sort Zang KeYan
collection DOAJ
description <p>Abstract</p> <p>The release and transfer of GaN epilayers to other substrates is of interest for a variety of applications, including heterogeneous integration of silicon logic devices, III&#8211;V power devices and optical devices. We have developed a simple wet chemical etching method to release high-quality epitaxial III-nitride films from their substrates. This method builds on a nanoepitaxial lateral overgrowth (NELO) process that provides III-Nitride films with low dislocation densities. NELO is accomplished using a nanoporous mask layer patterned on GaN substrates. Chemical removal of the SiO<sub>2</sub> layer after growth of III-Nitride overlayers causes fracture at the interface between the GaN film and the original GaN substrate, resulting in free-standing GaN films with nanostructured surfaces on one side. These layers can be transferred to other substrates, and the nano-structured surface can be used in photonic devices, or planarized for power devices.</p>
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spelling doaj.art-a5876f9052014037bb3c13a16b328d792023-09-02T14:39:22ZengSpringerOpenNanoscale Research Letters1931-75731556-276X2010-01-015610511056A New Method for Lift-off of III-Nitride Semiconductors for Heterogeneous IntegrationZang KeYanCheong DavyWCLiu HongFeiLiu HongTeng JingHuaChua SooJin<p>Abstract</p> <p>The release and transfer of GaN epilayers to other substrates is of interest for a variety of applications, including heterogeneous integration of silicon logic devices, III&#8211;V power devices and optical devices. We have developed a simple wet chemical etching method to release high-quality epitaxial III-nitride films from their substrates. This method builds on a nanoepitaxial lateral overgrowth (NELO) process that provides III-Nitride films with low dislocation densities. NELO is accomplished using a nanoporous mask layer patterned on GaN substrates. Chemical removal of the SiO<sub>2</sub> layer after growth of III-Nitride overlayers causes fracture at the interface between the GaN film and the original GaN substrate, resulting in free-standing GaN films with nanostructured surfaces on one side. These layers can be transferred to other substrates, and the nano-structured surface can be used in photonic devices, or planarized for power devices.</p>http://dx.doi.org/10.1007/s11671-010-9601-6NanorodLift offIII-nitride semiconductor
spellingShingle Zang KeYan
Cheong DavyWC
Liu HongFei
Liu Hong
Teng JingHua
Chua SooJin
A New Method for Lift-off of III-Nitride Semiconductors for Heterogeneous Integration
Nanoscale Research Letters
Nanorod
Lift off
III-nitride semiconductor
title A New Method for Lift-off of III-Nitride Semiconductors for Heterogeneous Integration
title_full A New Method for Lift-off of III-Nitride Semiconductors for Heterogeneous Integration
title_fullStr A New Method for Lift-off of III-Nitride Semiconductors for Heterogeneous Integration
title_full_unstemmed A New Method for Lift-off of III-Nitride Semiconductors for Heterogeneous Integration
title_short A New Method for Lift-off of III-Nitride Semiconductors for Heterogeneous Integration
title_sort new method for lift off of iii nitride semiconductors for heterogeneous integration
topic Nanorod
Lift off
III-nitride semiconductor
url http://dx.doi.org/10.1007/s11671-010-9601-6
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