Differential phase contrast for quantitative imaging and spectro-microscopy at a nanoprobe beamline

Differential phase contrast for quantitative imaging and spectro-microscopy at a nanoprobe beamline

The interaction of a focused X-ray beam with a sample in a scanning probe experiment can provide a variety of information about the interaction volume. In many scanning probe experiments X-ray fluorescence (XRF) is supplemented with measurements of the transmitted or scattered intensity using a pixe...

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Bibliographic Details
Main Authors: Paul D. Quinn, Fernando Cacho-Nerin, Miguel A. Gomez-Gonzalez, Julia E. Parker, Timothy Poon, Jessica M. Walker
Format: Article
Language:English
Published: International Union of Crystallography 2023-01-01
Series:Journal of Synchrotron Radiation
Subjects:
differential phase contrast
dpc
ptychography
nanoprobe
spectro-microscopy
Online Access:http://scripts.iucr.org/cgi-bin/paper?S1600577522010633

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http://scripts.iucr.org/cgi-bin/paper?S1600577522010633

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