Research on Electronic Circuit Fault Diagnosis Method Based on SWT and DCNN-ELM

Research on Electronic Circuit Fault Diagnosis Method Based on SWT and DCNN-ELM

The increase in the complexity of modern electronic products has brought significant challenges to the fault diagnosis of electronic circuits, and current fault diagnosis methods have problems such as long fault identification time, inaccurate positioning, and low diagnostic efficiency. In response...

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Bibliographic Details
Main Authors: Yu Zhang, Zhonghua Cheng, Zhenghao Wu, Enzhi Dong, Runze Zhao, Guangyao Lian
Format: Article
Language:English
Published: IEEE 2023-01-01
Series:IEEE Access
Subjects:
Electronic circuits
fault diagnosis
synchrosqueezing wavelet transform
deep convolutional neural network
extreme learning machine
Online Access:https://ieeexplore.ieee.org/document/10172199/

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