Open-loop amplitude-modulation Kelvin probe force microscopy operated in single-pass PeakForce tapping mode
The open-loop (OL) variant of Kelvin probe force microscopy (KPFM) provides access to the voltage response of the electrostatic interaction between a conductive atomic force microscopy (AFM) probe and the investigated sample. The measured response can be analyzed a posteriori, modeled, and interpret...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
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Beilstein-Institut
2021-10-01
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| Series: | Beilstein Journal of Nanotechnology |
| Subjects: | |
| Online Access: | https://doi.org/10.3762/bjnano.12.83 |