A New Computational Model of Step Gauge Calibration Based on the Synthesis Technology of Multi-Path Laser Interferometers

A step gauge is a commonly used length standard for international comparison, and its calibration accuracy is often used as a sign to measure a country’s length Calibration and Measurement Capability (CMC). Based on this, some developed countries and developing countries all over the world...

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Bibliographic Details
Main Authors: Guoying Ren, Xinghua Qu, Xiangjun Chen
Format: Article
Language:English
Published: MDPI AG 2020-03-01
Series:Applied Sciences
Subjects:
Online Access:https://www.mdpi.com/2076-3417/10/6/2089
Description
Summary:A step gauge is a commonly used length standard for international comparison, and its calibration accuracy is often used as a sign to measure a country’s length Calibration and Measurement Capability (CMC). Based on this, some developed countries and developing countries all over the world have been carrying out the research of precision calibration technology for step gauge. On the basis of summarizing the current situation of step gauge calibration technology in other countries, this paper presents a new computational model of step gauge calibration based on the Synthesis Technology of Multi-Path Laser Interferometers (SMLI) and an auto-collimator, which can synthesize the three laser light paths into the measured centerline of step gauge. It is very important to obtain a good measurement accuracy for the step gauge, conformed to the Abbe principle, no matter where it is installed on the CMM measurement platform. In this paper, the development of the mathematical model, the data collection algorithms, data analysis techniques, and measurement uncertainty budgets are discussed. Finally, the experimental measurement is carried out and the measurement accuracy is verified to be effective. The results show that this method can effectively avoid the influence of Abbe error in length measurement, and significantly enhance the calibration accuracy of the step gauge.
ISSN:2076-3417