Spectral denoising based on Hilbert–Huang transform combined with F-test

Due to the influence of uncontrollable factors such as the environment and instruments, noise is unavoidable in a spectral signal, which may affect the spectral resolution and analysis result. In the present work, a novel spectral denoising method is developed based on the Hilbert–Huang transform (H...

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Main Authors: Xihui Bian, Mengxuan Ling, Yuanyuan Chu, Peng Liu, Xiaoyao Tan
Format: Article
Language:English
Published: Frontiers Media S.A. 2022-08-01
Series:Frontiers in Chemistry
Subjects:
Online Access:https://www.frontiersin.org/articles/10.3389/fchem.2022.949461/full
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author Xihui Bian
Xihui Bian
Xihui Bian
Mengxuan Ling
Mengxuan Ling
Mengxuan Ling
Yuanyuan Chu
Peng Liu
Xiaoyao Tan
author_facet Xihui Bian
Xihui Bian
Xihui Bian
Mengxuan Ling
Mengxuan Ling
Mengxuan Ling
Yuanyuan Chu
Peng Liu
Xiaoyao Tan
author_sort Xihui Bian
collection DOAJ
description Due to the influence of uncontrollable factors such as the environment and instruments, noise is unavoidable in a spectral signal, which may affect the spectral resolution and analysis result. In the present work, a novel spectral denoising method is developed based on the Hilbert–Huang transform (HHT) and F-test. In this approach, the original spectral signal is first decomposed by empirical mode decomposition (EMD). A series of intrinsic mode functions (IMFs) and a residual (r) are obtained. Then, the Hilbert transform (HT) is performed on each IMF and r to calculate their instantaneous frequencies. The mean and standard deviation of instantaneous frequencies are calculated to further illustrate the IMF frequency information. Third, the F-test is used to determine the cut-off point between noise frequency components and non-noise ones. Finally, the denoising signal is reconstructed by adding the IMF components after the cut-off point. Artificially chemical noised signal, X-ray diffraction (XRD) spectrum, and X-ray photoelectron spectrum (XPS) are used to validate the performance of the method in terms of the signal-to-noise ratio (SNR). The results show that the method provides superior denoising capabilities compared with Savitzky–Golay (SG) smoothing.
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spelling doaj.art-a7e75570de964cb298bc4ef5759fe9262022-12-22T04:19:00ZengFrontiers Media S.A.Frontiers in Chemistry2296-26462022-08-011010.3389/fchem.2022.949461949461Spectral denoising based on Hilbert–Huang transform combined with F-testXihui Bian0Xihui Bian1Xihui Bian2Mengxuan Ling3Mengxuan Ling4Mengxuan Ling5Yuanyuan Chu6Peng Liu7Xiaoyao Tan8Key Laboratory of Separation Membranes and Membrane Processes, School of Chemical Engineering and Technology, Tiangong University, Tianjin, ChinaKey Lab of Process Analysis and Control of Sichuan Universities, Yibin University, Sichuan, ChinaState Key Laboratory of Plateau Ecology and Agriculture, Qinghai University, Xining, ChinaKey Laboratory of Separation Membranes and Membrane Processes, School of Chemical Engineering and Technology, Tiangong University, Tianjin, ChinaKey Lab of Process Analysis and Control of Sichuan Universities, Yibin University, Sichuan, ChinaState Key Laboratory of Plateau Ecology and Agriculture, Qinghai University, Xining, ChinaKey Laboratory of Separation Membranes and Membrane Processes, School of Chemical Engineering and Technology, Tiangong University, Tianjin, ChinaKey Laboratory of Separation Membranes and Membrane Processes, School of Chemical Engineering and Technology, Tiangong University, Tianjin, ChinaKey Laboratory of Separation Membranes and Membrane Processes, School of Chemical Engineering and Technology, Tiangong University, Tianjin, ChinaDue to the influence of uncontrollable factors such as the environment and instruments, noise is unavoidable in a spectral signal, which may affect the spectral resolution and analysis result. In the present work, a novel spectral denoising method is developed based on the Hilbert–Huang transform (HHT) and F-test. In this approach, the original spectral signal is first decomposed by empirical mode decomposition (EMD). A series of intrinsic mode functions (IMFs) and a residual (r) are obtained. Then, the Hilbert transform (HT) is performed on each IMF and r to calculate their instantaneous frequencies. The mean and standard deviation of instantaneous frequencies are calculated to further illustrate the IMF frequency information. Third, the F-test is used to determine the cut-off point between noise frequency components and non-noise ones. Finally, the denoising signal is reconstructed by adding the IMF components after the cut-off point. Artificially chemical noised signal, X-ray diffraction (XRD) spectrum, and X-ray photoelectron spectrum (XPS) are used to validate the performance of the method in terms of the signal-to-noise ratio (SNR). The results show that the method provides superior denoising capabilities compared with Savitzky–Golay (SG) smoothing.https://www.frontiersin.org/articles/10.3389/fchem.2022.949461/fulldenoisingHilbert–Huang transformempirical mode decompositionx-ray diffractionx-ray photoelectron spectrumf-test
spellingShingle Xihui Bian
Xihui Bian
Xihui Bian
Mengxuan Ling
Mengxuan Ling
Mengxuan Ling
Yuanyuan Chu
Peng Liu
Xiaoyao Tan
Spectral denoising based on Hilbert–Huang transform combined with F-test
Frontiers in Chemistry
denoising
Hilbert–Huang transform
empirical mode decomposition
x-ray diffraction
x-ray photoelectron spectrum
f-test
title Spectral denoising based on Hilbert–Huang transform combined with F-test
title_full Spectral denoising based on Hilbert–Huang transform combined with F-test
title_fullStr Spectral denoising based on Hilbert–Huang transform combined with F-test
title_full_unstemmed Spectral denoising based on Hilbert–Huang transform combined with F-test
title_short Spectral denoising based on Hilbert–Huang transform combined with F-test
title_sort spectral denoising based on hilbert huang transform combined with f test
topic denoising
Hilbert–Huang transform
empirical mode decomposition
x-ray diffraction
x-ray photoelectron spectrum
f-test
url https://www.frontiersin.org/articles/10.3389/fchem.2022.949461/full
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