Fabrication and micromagnetic modeling of barium hexaferrite thin films by RF magnetron sputtering
The synthesis and characterization of thin M-type barium hexaferrite (BaFe12O19 or BaM) films on silicon are reported. Multilayer in situ technique was employed to anneal the films at 850–900 °C for 10 min. The thickness dependence of the magnetic properties of the BaM films has been investigated us...
| Հիմնական հեղինակներ: | , |
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| Ձևաչափ: | Հոդված |
| Լեզու: | English |
| Հրապարակվել է: |
Elsevier
2018-03-01
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| Շարք: | Results in Physics |
| Առցանց հասանելիություն: | http://www.sciencedirect.com/science/article/pii/S2211379717316923 |